Dong-Hoon Kim
Samsung
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Publication
Featured researches published by Dong-Hoon Kim.
international reliability physics symposium | 2016
Dong-Hoon Kim; Jungdong Kim; Kidan Bae; Hye-jin Kim; Lira Hwang; Sang-chul Shin; Hyung-Nyung Park; Intaek Ku; Jongwoo Park; Sangwoo Pae; Haebum Lee
Display Driver IC is used to operate the display panel of mobile devices, such as handheld smartphones and tablets. Low power consumption becomes very important in mobile segments, thus High-k (HK)/ metal-gate (MG) process was used to fabricate DDI products. In this paper, an abnormal leakage increase observed during HTOL will be discussed along with the physical mechanism and superb HTOL results after process fixes have been implemented. As result, final DDI product showed an excellent reliability results through 1500hrs of HTOL exceeding product end of life (EOL).
Archive | 2005
Dong-Hoon Kim; Jong-Dae Park; Jin-Sung Choi
Archive | 2003
Dong-Hoon Kim; Jong-Dae Park; Kyu-Seok Kim; Jeong-hwan Lee; Jae-Ho Jung
Archive | 2010
Joo-woan Cho; Seong-Sik Choi; Hyeong-Yong Jang; Tae-Seok Jang; Jin-Sung Choi; Du-Hwan Chung; Dong-Hoon Kim; Seung-Ha Shin
Archive | 2005
Jin-Sung Choi; Jheen-Hyeok Park; Dong-Hoon Kim; Jong-Dae Park; Jin-Mi Jung; Jeong-hwan Lee
Archive | 2008
Dong-Hoon Kim; Jin-Sung Choi; Joong-Hyun Kim; Seunghwan Chung; Seung-Mo Kim
Archive | 2003
Dong-Hoon Kim; Jong-Dae Park; Kyu-Seok Kim; Jeong-hwan Lee; Jae-Ho Jung; Mansuk Kim; Chul-Goo Chi; O-Yong Jeong
Archive | 2008
Dong-Hoon Kim; Jin-Sung Choi; Jeong-hwan Lee; Seung-Mo Kim
Archive | 2005
Jin-Sung Choi; Jong-Dae Park; Jeoung-Gwen Lee; Dong-Hoon Kim
Archive | 2005
Dong-Hoon Kim; Jong-Dae Park; Jin-Sung Choi