Du Piyi

BST Thin Film Deposited on Glass Substrate with TISI Nanowire Electrode by RF-Sputtering Method

Ferroelectric Ba 0.7 Sr 0.3 TiO 3 (BST) thin film is sputtered on the titanium silicide bottom layer with TiSi nanowires on glass substrate at room temperature and annealed at 450°C for 30 minutes. The phase structure, morphology, dielectric properties of the BST thin film are measured by X-ray diffraction, Field emission scanning electron microscopy, and Impedance Analyzer, respectively. The results show that the crystallinity of the BST thin film is perfect, and the capacitance is independent on the frequency between about 100 KHz and 8 MHz. The tunability is 52.1% with 9V applied dc bias voltage and the dielectric loss is below 0.09.

Simulation of scattering in dense medium by Monte Carlo method

We present a Monte Carlo (MC) method to simulate the scattering for medium within randomly distributed particles, discuss the convergence of this method by varying the size parameter ka, volume parameter η and calculation parameter Ni, then compare this method with the classical iteration method with the same parameters. The calculation results showed that this method has good convergence and accords with the iteration method while consuming less CPU time. At the end of this paper, this method is used to discuss the visual light scatter in the c-Si/α-Si films.