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Dive into the research topics where E. Neubauer is active.

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Featured researches published by E. Neubauer.


Thin Solid Films | 2003

The influence of mechanical adhesion of copper coatings on carbon surfaces on the interfacial thermal contact resistance

E. Neubauer; G. Korb; C. Eisenmenger-Sittner; H. Bangert; S. Chotikaprakhan; D. Dietzel; A.M. Mansanares; B.K. Bein

The weak mechanical and thermal interface in Copper based Metal Matrix Composites (MMCs) reinforced by carbon fibers is the background of this research study. In order to investigate the mechanical adhesion strength and the thermal contact resistance between copper and carbon, a simplified model system based on coated flat carbon substrates has been used. Cu coatings of approximately 1 μm thickness on intermediate Ti bond layers have been deposited on carbon substrates by a sputter deposition process. The resulting different adhesion strengths between coating and substrate have been measured by means of a pull-off method, and non-destructive photothermal method, giving information on the depth-resolved thermal properties of the samples has been used to determine the Thermal Contact Resistance (TCR). By combining the results of mechanical adhesion tests and of photothermal IR radiometry, the correlation of the mechanical adhesion of Cu coatings on Carbon surfaces with the interfacial thermal contact resistance has been analysed.


Vacuum | 2003

AFM and AUGER investigations of as-deposited and heat treated copper coatings on glassy carbon surfaces with titanium intermediate layers

E. Neubauer; C. Eisenmenger-Sittner; H. Bangert; G Korb

Copper carbon composites are a prospective material for application as heat sink material in thermal management applications. One of the main drawbacks of this material combination is the lack of adhesion between copper and carbon. In order to improve the interfacial properties in this system a basic investigation on carbon substrates was done, where the influence of an adhesion promoting intermediate layer was investigated. Besides the study of the influence of a Ti intermediate layer on the growth mode and surface topography of a copper coating, the diffusion of Ti after a heat treatment was analysed by using Auger electron spectroscopy.


Thin Solid Films | 2004

Solid state de-wetting observed for vapor deposited copper films on carbon substrates

C. Schrank; C. Eisenmenger-Sittner; E. Neubauer; H. Bangert; A. Bergauer


Applied Surface Science | 2006

Modification of wetting of copper (Cu) on carbon (C) by plasma treatment and molybdenum (Mo) interlayers

C. Eisenmenger-Sittner; C. Schrank; E. Neubauer; E. Eiper; J. Keckes


Surface & Coatings Technology | 2006

Molybdenum interlayers as adhesion promotors for thin copper films on plasma treated glassy carbon

B. Schwarz; C. Schrank; C. Eisenmenger-Sittner; Michael Stöger-Pollach; M. Rosner; E. Neubauer


Surface & Coatings Technology | 2012

Characterisation of sputter deposited niobium and boron interlayer in the copper–diamond system

J. Hell; Mihai Chirtoc; C. Eisenmenger-Sittner; H. Hutter; N. Kornfeind; P. Kijamnajsuk; M. Kitzmantel; E. Neubauer; K. Zellhofer


Analytical and Bioanalytical Chemistry | 2002

Adhesion promotion of Cu on C by Cr intermediate layers investigated by the SIMS method

K. Mayerhofer; E. Neubauer; C. Eisenmenger-Sittner; H. Hutter


Surface & Coatings Technology | 2004

Solid state de-wetting of vapor deposited films on planar and fiber-shaped carbon substrates

C. Eisenmenger-Sittner; E. Neubauer; C. Schrank; J. Brenner; C. Tomastik


Vacuum | 2009

Construction and characterization of a sputter deposition system for coating granular materials

J. Hell; M. Horkel; E. Neubauer; C. Eisenmenger-Sittner


Applied Surface Science | 2001

Characterisation of Cr intermediate layers in Cu–C-system with SIMS method

K. Mayerhofer; E. Neubauer; C. Eisenmenger-Sittner; Herbert Hutter

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C. Eisenmenger-Sittner

Vienna University of Technology

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H. Bangert

Vienna University of Technology

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D. Dietzel

Ruhr University Bochum

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C. Schrank

Vienna University of Technology

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H. Hutter

Vienna University of Technology

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J. Hell

Vienna University of Technology

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B. K. Bein

Ruhr University Bochum

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J. Pelzl

Ruhr University Bochum

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K. Mayerhofer

Vienna University of Technology

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