E. Zielony

Si/ZnO nanorods/Ag/AZO structures as promising photovoltaic plasmonic cells

The test structures for photovoltaic (PV) applications based on zinc oxide nanorods (NRs) that were grown using a low-temperature hydrothermal method on p-type silicon substrates (100) covered with Ag nanoparticles (NPs) were studied. The NPs of three different diameters, i.e., 5–10 nm, 20-30 nm, and 50–60 nm, were deposited using a sputtering method. The morphology and crystallinity of the structures were confirmed by scanning electron microscopy and Raman spectroscopy. It was found that the nanorods have a hexagonal wurtzite structure. An analysis of the Raman and photoluminescence spectra permitted the identification of the surface modes at 476 cm−1 and 561 cm−1. The presence of these modes is evidence of nanorods oriented along the wurtzite c-axis. The NRs with Ag NPs were covered with a ZnO:Al (AZO) layer that was grown using the low-temperature atomic layer deposition technique. The AZO layer served as a transparent ohmic contact to the ZnO nanorods. The applicability of the AZO layer for this purpo...

Photovoltaic properties of ZnO nanorods/p-type Si heterojunction structures

Summary Selected properties of photovoltaic (PV) structures based on n-type zinc oxide nanorods grown by a low temperature hydrothermal method on p-type silicon substrates (100) are investigated. PV structures were covered with thin films of Al doped ZnO grown by atomic layer deposition acting as transparent electrodes. The investigated PV structures differ in terms of the shapes and densities of their nanorods. The best response is observed for the structure containing closely-spaced nanorods, which show light conversion efficiency of 3.6%.

Deep traps in n-type GaN epilayers grown by plasma assisted molecular beam epitaxy

In this study, we present the results of investigations on Schottky Au-GaN diodes by means of conventional DLTS and Laplace DLTS methods within the temperature range of 77 K–350 K. Undoped GaN layers were grown using the plasma-assisted molecular beam epitaxy technique on commercial GaN/sapphire templates. The quality of the epilayers was studied by micro-Raman spectroscopy (μ-RS) which proved the hexagonal phase and good crystallinity of GaN epilayers as well as a slight strain. The photoluminescence spectrum confirmed a high crystal quality by intense excitonic emission but it also exhibited a blue emission band of low intensity. DLTS signal spectra revealed the presence of four majority traps: two high-temperature and two low-temperature peaks. Using the Laplace DLTS method and Arrhenius plots, the apparent activation energy and capture cross sections were obtained. For two high-temperature majority traps, they were equal to E1 = 0.65 eV, σ1 = 8.2 × 10−16 cm2 and E2 = 0.58 eV, σ2 = 2.6 × 10−15 cm2 wher...

Laser irradiation effects on the CdTe/ZnTe quantum dot structure studied by Raman and AFM spectroscopy

Micro-Raman spectroscopy has been applied to investigate the impact of laser irradiation on semiconducting CdTe/ZnTe quantum dots (QDs) structures. A reference sample (without dots) was also studied for comparison. Both samples were grown by molecular beam epitaxy technique on the p-type GaAs substrate. The Raman spectra have been recorded for different time of a laser exposure and for various laser powers. The spectra for both samples exhibit peak related to the localized longitudinal (LO) ZnTe phonon of a wavenumber equal to 210 cm−1. For the QD sample, a broad band corresponding to the LO CdTe phonon related to the QD-layer appears at a wavenumber of 160 cm−1. With increasing time of a laser beam exposure and laser power, the spectra get dominated by tellurium—related peaks appearing at wavenumbers around 120 cm−1 and 140 cm−1. Simultaneously, the ZnTe surface undergoes rising damage, with the formation of Te aggregates at the pinhole edge as reveal atomic force microscopy observations. Local temperatu...

Structural and optical characterization of GaN nanowires

Optical properties of GaN nanowires (NWs) grown by plasma-assisted molecular beam epitaxy on Si(111) substrates were studied with the use of micro-Raman spectroscopy and photoluminescence. Two types of NWs, hereafter labeled as A and B, grown with different values of Ga flux were studied. Morphology of the samples was probed by high resolution scanning electron microscopy. It was found that large Ga flux has led to a partial coalescence of nanowires in sample A. Reduction of Ga flux during growth of sample B resulted in an ensemble of separated nanowires. Micro-Raman and photoluminescence spectra were taken under illumination of 325 nm He-Cd laser line. Micro-Raman data reveal hexagonal phase of GaN NWs as well as a slight strain of Si substrate. Photoluminescence data yield that ensembles of separated NWs in sample B are defect free, whereas the spectra for coalesced wires in sample A exhibit both broad yellow luminescence band and defect-related band centered around 3.36 eV. Moreover, it was found that ...

Trap levels in the atomic layer deposition-ZnO/GaN heterojunction—Thermal admittance spectroscopy studies

In this work, a n-ZnO/p-GaN heterojunction is analyzed using admittance spectroscopy techniques. Capacitance transient measurements performed at 10 kHz reveal four majority-carrier deep levels, the most important one located at approximately 0.57 eV below the ZnO conduction band (CB) edge with a density about two orders of magnitude below the doping level (NT = 4 × 1015 cm−3). The others, located at 0.20 eV, 0.65 eV, and 0.73 eV, are about three orders of magnitude below the doping level (NT = 4–9 × 1014 cm−3).

Electrical and photovoltaic properties of CdTe/ZnTe n-i-p junctions grown by molecular beam epitaxy

Preliminary studies have been performed on photoelectrical properties of CdTe/ZnTe n-i-p junctions grown using the molecular beam epitaxy technique. Photovoltaic properties of the cells have been investigated by the measurements of current-voltage (I-V) characteristics under 1-sun illumination. I-V characteristics yield efficiencies of the cells varying from 3.4% to 4.9%. The low efficiency can be due to the presence of electrically active defects. In order to study the origin of defects in CdTe/ZnTe photovoltaic junctions, space charge techniques (C-V and deep level transient spectroscopy (DLTS)) have been applied. From the C-V measurements, a doping profile was calculated confirming charge accumulation in the i-CdTe layer. The results of the DLTS studies revealed the presence of four traps within a temperature range from 77–420 K. Three of them with activation energies equal to 0.22 eV, 0.45 eV, and 0.78 eV have been ascribed to the hole traps present in the i-CdTe material and their possible origin has...

Deep levels in GaN studied by deep level transient spectroscopy and Laplace transform deep-level spectroscopy

In this study we present the results of investigations on Schottky Au-GaN diodes by means of conventional DLTS and Laplace DLTS methods within the temperature range of 77–350 K. Si-doped GaN layers were grown by Molecular Beam Epitaxy technique (MBE) on sapphire substrates. DLTS signal spectra revealed the presence of four majority traps: two hightemperature and two low-temperature peaks. Using LDLTS method and Arrhenius plots the activation energy and capture cross sections were obtained. For two high-temperature majority traps they are equal to E1 = 0.65 eV, σ1 = 8.2 × 10−16cm2 and E2 = 0.58 eV, σ2 = 2.6 × 10−15 cm2 whereas for the two low-temperature majority traps E3 = 0.18 eV, σ3 = 9.72 × 10−18 cm2 and E4 = 0.13 eV, σ4 = 9.17 × 10−18 cm2. It was also found that the traps are related to point defects. Possible origin of the traps was discussed and the results were compared with the data found elsewhere [1–5].

Electro-optical properties of diluted GaAsN on GaAs grown by APMOVPE

In this paper we report on the optical and electrical studies of single GaAs1−xNx epitaxial layers grown on GaAs substrates by means of atmospheric pressure metal organic vapour phase epitaxy (APMOVPE). Three kinds of samples with 1.2 %, 1.6 % and 2.7 % nitrogen content were studied. Optical properties of the layers were investigated with the use of room temperature transmittance and reflectance measurements. Subsequently Schottky Au-GaAs1−xNx contacts were processed and characterized by current-voltage (I-V) and capacitance-voltage (C-V) measurements within 80–480 K temperature range. From the I-V and C-V characteristics the ideality factor, series resistance and built-in potential were determined. Obtained diodes can be used for further studies on defects with the use of DLTS method.

Struktury na bazie ZnO do detekcji światła ultrafioletowego

In our paper, two p-Si/n-ZnMgO structures were characterized in terms of applicability in ultraviolet light detectors. A few measurement techniques have been applied: current-voltage (I-V) characteristics, photoluminescence (PL) and photoresponsivity measurements. I-V characteristics were measured at 310 K and allowed us to conlcude, that both of investigated structures have rectifying properties. Photoluminescence and photoresposivity measurements were performed at room temperature. The analysis of PL spectra exhibited emission bands corresponding to defects in one of studied samples. Photoresponsivity spectra were also thoroughly examined – the most important disadvantages of analysed structures were given together with possible solutions, which can be applied in order to obtain well-working UV detectors. (ZnO-based structures for ultraviolet detectors). Słowa kluczowe: ZnO, Si, heterostruktury, fotoodpowiedź, detektory, UV.