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Ecker Wolfgang

Infineon Technologies

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Publication

Featured researches published by Ecker Wolfgang.

Archive | 2000

Test environment for testing electronic systems and method for testing systems by means of a test environment

Bauer Matthias; Henftling Renate; Ecker Wolfgang

Archive | 2002

Method for simulation of a circuit unit that is to be verified using a test bench arrangement, whereby an operator can precisely control time delays in test pattern sequences

Henftling Renate; Ecker Wolfgang; Zinn Andreas; Bauer Matthias; Pilsl Michael; Zambaldi Martin

Archive | 2002

Testumgebung und Verfahren zur Untersuchung elektronischer Systeme

Henftling Renate; Ecker Wolfgang; Zinn Andreas; Bauer Matthias

Archive | 2003

Circuit module simulation and/or testing method uses adapter for converting control data stream received by test bench element into interface data stream fed to tested circuit module

Henftling Renate; Ecker Wolfgang; Zinn Andreas; Bauer Matthias; Zambaldi Martin

Archive | 2003

Storage system determines faulty memory cells of main memory and accesses auxiliary memory cell allocated to faulty address provided in auxiliary memory cell when faulty address is detected

Ecker Wolfgang

Archive | 2003

Method of simulating circuit unit to be verified, by clocking test-bench elements of circuit unit and test bench controller and evaluating simulation results

Henftling Renate; Ecker Wolfgang; Zinn Andreas; Bauer Matthias; Zambaldi Martin

Archive | 2003

Verfahren zum Anschließen von Testbenchelementen und Vorrichtung

Henftling Renate; Ecker Wolfgang; Zinn Andreas; Bauer Matthias; Zambaldi Martin

Archive | 2003

Simulating circuit-under-test for verification of test logic integrated in circuit-under-test, by supplying control data stream from test bench controller, and using test signals to verify function

Henftling Renate; Ecker Wolfgang; Zinn Andreas; Bauer Matthias; Zambaldi Martin

Archive | 2003

Method of running linear store e.g. for processor systems, requires updating used storage zones via driver circuit

Ecker Wolfgang

Archive | 2003

Circuit module simulation testing method has control data stream from test bench controller used for provision of test bench element configuration data stream

Henftling Renate; Zinn Andreas; Ecker Wolfgang; Bauer Matthias; Zambaldi Martin

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Collaboration

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Bauer Matthias

Infineon Technologies

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Henftling Renate

Infineon Technologies

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Zinn Andreas

Infineon Technologies

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Zambaldi Martin

Infineon Technologies

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Mades Jochen

Infineon Technologies

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Pilsl Michael

Infineon Technologies

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Schneider Thomas

Infineon Technologies

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Windisch Andre

Infineon Technologies

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Yang Ke

Infineon Technologies

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