Edoardo Charbon

Design and characterization of a CMOS 3-D image sensor based on single photon avalanche diodes

The design and characterization of an imaging system is presented for depth information capture of arbitrary three-dimensional (3-D) objects. The core of the system is an array of 32 /spl times/ 32 rangefinding pixels that independently measure the time-of-flight of a ray of light as it is reflected back from the objects in a scene. A single cone of pulsed laser light illuminates the scene, thus no complex mechanical scanning or expensive optical equipment are needed. Millimetric depth accuracies can be reached thanks to the rangefinders optical detectors that enable picosecond time discrimination. The detectors, based on a single photon avalanche diode operating in Geiger mode, utilize avalanche multiplication to enhance light detection. On-pixel high-speed electrical amplification can therefore be eliminated, thus greatly simplifying the array and potentially reducing its power dissipation. Optical power requirements on the light source can also be significantly relaxed, due to the arrays sensitivity to single photon events. A number of standard performance measurements, conducted on the imager, are discussed in the paper. The 3-D imaging system was also tested on real 3-D subjects, including human facial models, demonstrating the suitability of the approach.

A 128

An imager for time-resolved optical sensing was fabricated in CMOS technology. The sensor comprises an array of 128times128 single-photon pixels, a bank of 32 time-to-digital-converters, and a 7.68 Gbps readout system. Thanks to the outstanding timing precision of single-photon avalanche diodes and the optimized measurement circuitry, a typical resolution of 97 ps was achieved within a range of 100 ns. To the best of our knowledge, this imager is the first fully integrated system for photon time-of-arrival evaluation. Applications include 3-D imaging, optical rangefinding, fast fluorescence lifetime imaging, imaging of extremely fast phenomena, and, more generally, imaging based on time-correlated single photon counting. When operated as an optical rangefinder, this design has enabled us to reconstruct 3-D scenes with milimetric precisions in extremely low signal exposure. A laser source was used to illuminate the scene up to 3.75 m with an average power of 1 mW, a field-of-view of 5deg and under 150 lux of constant background light. Accurate distance measurements were repeatedly achieved based on a short integration time of 50 ms even when signal photon count rates as low as a few hundred photons per second were available.

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A methodology for the automatic synthesis of full-custom IC layout with analog constraints is presented. The methodology guarantees that all performance constraints are met when feasible, or otherwise, infeasibility is detected as soon as possible, thus providing a robust and efficient design environment. In the proposed approach, performance specifications are translated into lower-level bounds on parasitics or geometric parameters, using sensitivity analysis. Bounds can be used by a set of specialized layout tools performing stack generation, placement, routing, and compaction. For each tool, a detailed description is provided of its functionality, of the way constraints are mapped and enforced, and of its impact on the design flow. Examples drawn from industrial applications are reported to illustrate the effectiveness of the approach.

128 Single-Photon Image Sensor With Column-Level 10-Bit Time-to-Digital Converter Array

We report on the first implementation of a single photon avalanche diode (SPAD) in 130 nm complementary metal-oxide-semiconductor (CMOS) technology. The SPAD is fabricated as p+/n-well junction with octagonal shape. A guard ring of p-well around the p+ anode is used to prevent premature discharge. To investigate the dynamics of the new device, both active and passive quenching methods have been used. Single photon detection is achieved by sensing the avalanche using a fast comparator. The SPAD exhibits a maximum photon detection probability of 41% and a typical dark count rate of 100 kHz at room temperature. Thanks to its timing resolution of 144 ps full-width at half-maximum (FWHM), the SPAD has several uses in disparate disciplines, including medical imaging, 3D vision, biophotonics, low-light illumination imaging, etc.

Automation of IC layout with analog constraints

Watermarking is one of several techniques available today to deter copyright infringement in electronic systems. The technique consists of implanting indelible stamps in the circuits inner structure, while not disrupting its functionality nor degrading its performance significantly. In this paper, a novel method is proposed for the creation of watermarks in regular sequential functions. This is an important class of functions, as it is the basis of most digital controllers. Algorithms are proposed for implanting robust watermarks to minimize the overhead and, ultimately, to reduce the impact on performance. Detection methods have been discussed in the presence of infringement attacks. The resilience of the method in several tampering regimes has been estimated. Examples illustrate the suitability of the approach.

A Single Photon Avalanche Diode Implemented in 130-nm CMOS Technology

We report on the design and characterization of a novel time-resolved image sensor fabricated in a 130 nm CMOS process. Each pixel within the 3232 pixel array contains a low-noise single-photon detector and a high-precision time-to-digital converter (TDC). The 10-bit TDC exhibits a timing resolution of 119 ps with a timing uniformity across the entire array of less than 2 LSBs. The differential non-linearity (DNL) and integral non-linearity (INL) were measured at ±0.4 and ±1.2 LSBs, respectively. The pixel array was fabricated with a pitch of 50 μm in both directions and with a total TDC area of less than 2000 μm2. The target application for this sensor is time-resolved imaging, in particular fluorescence lifetime imaging microscopy and 3D imaging. The characterization shows the suitability of the proposed sensor technology for these applications.

Watermarking-based copyright protection of sequential functions

Phase and intensity of light are detected simultaneously using a fully digital imaging technique: single-photon synchronous detection. This approach has been theoretically and experimentally investigated in this paper. We designed a fully integrated camera implementing the new technique that was fabricated in a 0.35 mum CMOS technology. The camera demonstrator features a modulated light source, so as to independently capture the time-of-flight of the photons reflected by a target, thereby reconstructing a depth map of the scene. The camera also enables image enhancement of 2D scenes when used in passive mode, where differential maps of the reflection patterns are the basis for advanced image processing algorithms. Extensive testing has shown the suitability of the technique and confirmed phase accuracy predictions. Experimental results showed that the proposed rangefinder method is effective. Distance measurement performance was characterized with a maximum nonlinearity error lower than 12 cm within a range of a few meters. In the same range, the maximum repeatability error was 3.8 cm.

A Time-Resolved, Low-Noise Single-Photon Image Sensor Fabricated in Deep-Submicron CMOS Technology

A formalization of the watermarking problem is presented and basic algorithms for its generation and detection at several abstraction levels are proposed. The concepts of robustness against forgery and theft tracing are analyzed in light of the proposed algorithms.

Single-Photon Synchronous Detection

Techniques are presented to compactly represent substrate noise currents injected by digital networks. Using device-level simulation, every gate in a given library is modeled by means of the signal waveform it injects into the substrate, depending on its input transition scheme. For a given sequence of input vectors, the switching activity of every node in the Boolean network is computed. Assuming that technology mapping has been performed, each node corresponds to a gate in the library, hence, to a specific injection waveform. The noise contribution of each node is computed by convolving its switching activity with the associated injection waveforms. The total injected noise for the digital block is then obtained by summing all the noise contributions in the circuit. The resulting injected noise can be viewed as a random process, whose power spectrum is computed using standard signal processing techniques. A study was performed on a number of standard benchmark circuits to verify the validity of the assumptions and to measure the accuracy of the obtained power spectra.

Hierarchical watermarking in IC design

The design and characterization of an imaging sensor based on single photon avalanche diodes is presented. The sensor was fully integrated in a 0.35μm CMOS technology. The core of the imager is an array of 4x112 pixels that independently and simultaneously detect the arrival time of photons with picosecond accuracy. A novel event-driven readout scheme allows parallel column-wise and non-sequential, on-demand row-wise operation. Both time-correlated and time-uncorrelated measurements are supported in the sensor. The readout scheme is scalable and requires only 11 transistors per pixel with a pitch of 25μm. A number of standard performance measurements for the imager are presented in the paper. An average dark count rate of 6Hz and 750Hz are reported at room temperature respectively for an active area diameter of 4μm and 10μm, while the dead time is 40ns with negligible crosstalk. A timing resolution better than 80ps over the entire integrated array makes this technique ideal for a fully integrated high resolution streak camera, thus enabling fast TCSPC experiments. Applications requiring low noise, picosecond timing accuracies, and measurement parallelism are prime candidates for this technology. Examples of such applications include bioimaging at cellular and molecular level based on fluorescence lifetime imaging and/or, fluorescence correlation spectroscopy, as well as fast optical imaging, optical rangefinders, LIDAR, and low light level imagers.