Edouard Da Silva
CentraleSupélec
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Publication
Featured researches published by Edouard Da Silva.
Applied Spectroscopy | 1995
Lars Markwort; Bert J. Kip; Edouard Da Silva; Bernard Roussel
Two alternative methods of Raman imaging, via global (wide-field) illumination and via point illumination in combination with confocal light collection, have been applied to the study of heterogeneous polymer systems. From the results obtained it becomes apparent that the fluorescence inherent to most polymer systems severely limits the use of global illumination. Furthermore, the lack in depth resolution in Raman imaging by global illumination ruled out this method for the study of bulk polymer samples. Also as a consequence of the absence of depth resolution, the global illumination technique appeared more vulnerable to artifacts arising from scattering effects due to the sample geometry and fluorescence. Hence, for a general application of Raman imaging to the study of polymer samples, Raman imaging by point illumination in conjunction with confocal light collection is the method of choice
Applied Spectroscopy | 2008
Michel D. Jouan; Nguyen Quy Dao; Edouard Da Silva; Duong Ai Phuong
In this paper, the performances of four improved analytical methods (backward stepwise selection of peak intensities, sum of characteristic peaks of a component, moving window partial least squares, and genetic algorithms) using wavelength selection for the analysis of xylene mixtures by Raman spectroscopy are tested for further use on the new “digital micromirror device associated with a photomultiplier tube” Raman spectrometer. It is shown that the errors of prediction using only a few selected points (from 4 to 49 depending on the method) are almost the same as when using the whole spectral range (1050 points). Compared to the last two methods, the “backward stepwise selection of peak intensities” and “sum of characteristic peaks of a component” methods are robust under industrial conditions and appear to be well suited for chemical quantitative analysis with the new Raman spectrometer, which allows the measurements of the total intensity to be made simultaneously for a number of pre-selected frequencies. Results show that the errors of prediction can be near to or even lower than 2%.
Archive | 1984
Michel Delhaye; Andre Deffontaine; Andre Chapput; Michel Bridoux; Edouard Da Silva
Archive | 1992
Michel Delhaye; Edouard Da Silva; Gerard Martinez
Archive | 2000
Edouard Da Silva; Michel Delhaye; Michel Leclercq; Bernard Roussel
Archive | 1995
Edouard Da Silva; Michel Delhaye; Jacques Barbillat
Archive | 1982
M. Delhaye; P. Dhamelincourt; Edouard Da Silva; Jacques Barbillat
Archive | 1991
Michel Delhaye; Edouard Da Silva; Bernard Roussel
Journal of Raman Spectroscopy | 1999
Jacques Barbillat; Bernard Roussel; Edouard Da Silva
Archive | 1998
Edouard Da Silva; Michel Delhaye; Michel Leclercq; Bernard Roussel