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Dive into the research topics where Edward B. Saloman is active.

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Featured researches published by Edward B. Saloman.


Journal of Physical and Chemical Reference Data | 2004

Energy Levels and Observed Spectral Lines of Xenon, Xe I through Xe LIV

Edward B. Saloman

The energy levels and observed spectral lines of the xenon atom, in all stages of ionization for which experimental data are available, have been compiled. Sufficient data were found to generate level and line tables for Xe I–Xe XI, Xe XIX, Xe XXV–Xe XXIX, Xe XLIII–Xe XLV, and Xe LI–Xe LIV. For Xe LIII and Xe LIV theoretical values are compiled for the energy levels. In 15 of the other stages a few lines are reported. Experimental g factors are included for Xe I, Xe II, and Xe III. A value, either experimental, semiempirical, or theoretical, is included for the ionization energy of each ion.


Journal of Physical and Chemical Reference Data | 2010

Energy Levels and Observed Spectral Lines of Ionized Argon, Ar II through Ar XVIII

Edward B. Saloman

The energy levels and observed spectral lines of ionized argon atoms, in all stages of ionization, have been compiled. Sufficient experimental data were found to generate level and line tables for Ar II through Ar XV . For Ar XVI a mix of experimental and theoretical data were used. Because of the superiority of the theoretical data for Ar XVII and Ar XVIII , theoretical values are compiled for the energy levels and the lines are calculated from them. Experimental g-factors are included for Ar II . A value, either experimental, semiempirical, or theoretical, is included for the ionization energy of each ion.


Journal of Physical and Chemical Reference Data | 2007

Energy Levels and Observed Spectral Lines of Krypton, Kr I through Kr XXXVI

Edward B. Saloman

The energy levels and observed spectral lines of the krypton atom, in all stages of ionization for which experimental data are available, have been compiled. Sufficient data were found to generate level and line tables for Kr I–Kr X and Kr XVIII–Kr XXXVI. For Kr XXXV and Kr XXXVI and most of Kr XXXIV theoretical values are compiled for the energy levels. In all of the other stages a few lines, some of which may be only tentative classifications, are reported. In addition for Kr I, separate tables of energy levels are tabulated for the isotopes 86Kr and 84Kr. Experimental g factors are included for Kr I and Kr II. A value, either experimental, semiempirical, or theoretical, is included for the ionization energy of each ion.


Spectrochimica Acta Part B: Atomic Spectroscopy | 1991

A resonance ionization spectroscopy/resonance ionization mass spectrometry data service. II, Data sheets for Al, Ca, Cs, Cr, Co, Cu, Kr, Mg, Hg and Ni

Edward B. Saloman

Abstract A data service has been established at the National Institute of Standards and Technology to provide the necessary information to apply the techniques of Resonance Ionization Spectroscopy (RIS) and Resonance lonization Mass Spectrometry (RIMS) to routine use in analytical chemistry. This service collects and calculates the relevant atomic data, chooses appropriate resonance ionization schemes, and indicates pertinent operating details of successful RIMS studies. The first group of data sheets was published previously covering the elements As, B, Cd, C, Ge, Au, Fe, Pb, Si and Zn. The second group of data sheets is presented here. It covers the elements Al, Ca, Cs, Cr, Co, Cu, Kr, Mg, Hg and Ni. Others will be published periodically. Reprints of RIS/RIMS work are solicited so that those efforts may be included in future data sheets.


Spectrochimica Acta Part B: Atomic Spectroscopy | 1993

A resonance ionization spectroscopy/resonance ionization mass spectrometry data service: IV—Data sheets for Be, In, Li, K, Rb, Ag, Ti and V and an update of the data sheet for Ni

Edward B. Saloman

Abstract A data service has been established at the National Institute of Standards and Technology to provide the necessary information to apply the techniques of resonance ionization spectroscopy (RIS) and resonance ionization mass spectrometry (RIMS) to routine use m analytical chemistry. This service collects and calculates the relevant atomic data, chooses appropriate resonance ionization schemes, and indicates pertinent operating details of successful RIMS studies. The first group of data sheets was published previously covering the elements As, B, Cd, C, Ge, Au, Fe, Pb, Si and Zn. The second group published covered the elements Al, Ca, Cs, Cr, Co, Cu, Kr, Mg, Hg and Ni. The third group published covered the elements Sb, Bi, P, Na and Sn. The fourth group of data sheets is presented here. It covers the elements Be, In, Li, K, Rb, Ag, Ti and V. It also provides an update of the previously published data sheet for Ni. Reprints of RIS/RIMS work are solicited so that those efforts may be included in future data sheets.


Spectrochimica Acta Part B: Atomic Spectroscopy | 1990

A resonance ionization spectroscopy/resonance ionization mass spectrometry data service. I—Data sheets for As, B, Cd, C, Ge, Au, Fe, Pb, Si and Zn

Edward B. Saloman

Abstract A data service is being established at the National Institute of Standards and Technology to provide the necessary information to apply the techniques of resonance ionization spectroscopy (RIS) and resonance ionization mass spectrometry (RIMS) to routine use in analytical chemistry. This service will collect and calculate the relevant atomic data, choose appropriate resonance ionization schemes, and indicate pertinent operating details of successful RIMS studies. The first group of data sheets is included, covering the elements As, B, Cd, C, Ge, Au, Fe, Pb, Si and Zn. Others will be published periodically. Reprints of RIS/RIMS work are solicited so that those efforts may be included in future data sheets.


Journal of Physical and Chemical Reference Data | 2004

Wavelengths, Energy Level Classifications, and Energy Levels for the Spectrum of Neutral Neon

Edward B. Saloman; Craig J. Sansonetti

We have prepared a comprehensive critically evaluated compilation of the most accurate wavelength measurements for classified lines of neutral neon (Ne I) in its natural isotopic abundance. Data from 19 sources spanning the region 256 A to 54 931 A are included. Based on this line list we have derived optimized values for the energy levels of neutral neon. Tabular data for 1595 classified lines and 374 energy levels are provided. In addition to the observed wavelengths, we present revised wavelengths calculated from the optimized energy levels for all lines that have been previously recommended for use as secondary wavelength standards.


X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography | 1991

Interfaces in Mo/Si multilayers

Jon M. Slaughter; Patrick A. Kearney; Dean W. Schulze; Charles M. Falco; C. R. Hills; Edward B. Saloman; R N. Watts

Using state-of-the-art instruments and electron microscopy, the interfaces in Mo/Si multilayer mirrors fabricated by UHV electron-beam evaporation and by sputtering were examined. Peak shifts were observed in the XPS spectra at growth temperatures as low as 50 C, indicating the formation of silicide at the interface. The TEM micrographs showed that, in multilayers, the majority of the silicide formed at Mo on Si interfaces, rather than at Si on Mo interfaces. At 300 C, the multilayer structure is almost completely destroyed by the reaction. Mirrors with d(Mo) of about 40 A performed much better than those with d(Mo) of about 55 A. The Auger depth profiles showed that oxygen uptake in the sputtered samples and in samples evaporated at 200 C is limited to the top Mo layer, while samples evaporated at temperatures below 200 C had oxygen penetration through at least the first few bilayers, indicating that the silicide layers act as diffusion barriers to the oxygen.


Spectrochimica Acta Part B: Atomic Spectroscopy | 1992

A resonance ionization spectroscopy/resonance ionization mass spectrometry data service: III—Data sheets for Sb, Bi, P, Na and Sn

Edward B. Saloman

Abstract A data service has been established at the National Institute of Standards and Technology to provide the necessary information to apply the techniques of resonance ionization spectroscopy (RIS) and resonance ionization mass spectrometry (RIMS) to routine use in analytical chemistry. This service collects and calculates the relevant atomic data, chooses appropriate resonance ionization schemes, and indicates pertinent operating details of successful RIMS studies. The first group of data sheets was published previously covering the elements As, B, Cd, C, Ge, Au, Fe, Pb, Si, and Zn. The second group published covered the elements Al, Ca, Cs, Cr, Co, Cu, Kr, Mg, Hg, and Ni. The third group of data sheets is presented here. It covers the elements Sb, Bi, P, Na and Sn. Others will be published periodically. Reprints of RIS/RIMS work are solicited so that those efforts may be included in future data sheets.


Spectrochimica Acta Part B: Atomic Spectroscopy | 1994

A resonance ionization spectroscopy/resonance ionization mass spectrometry data service. V: Data sheets for Ga, Mn, Sc and Tl

Edward B. Saloman

Abstract A data service has been established at the National Institute of Standards and Technology to provide the necessary information to apply the techniques of resonance ionization spectroscopy (RIS) and resonance ionization mass spectrometry (RIMS) to routine use in analytical chemistry. This service collects and calculates the relevant atomic data, chooses appropriate resonance ionization schemes, and indicates pertinent operating details of successful RIMS studies. The first group of data sheets was published previously covering the elements As, B, Cd, C, Ge, Au, Fe, Pb, Si and Zn. The second group published covered the elements Al, Ca, Cs, Cr, Co, Cu, Kr, Mg, Hg and Ni. The third group published covered the elements Sb, Bi, P, Na and Sn. The fourth group published covered the elements Be, In, Li, K, Rb, Ag, Ti and V. The fifth group of data sheets is presented here. It covers the elements Ga, Mn, Sc and Tl.

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Alexander Kramida

National Institute of Standards and Technology

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Peter J. Mohr

National Institute of Standards and Technology

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William C. Martin

National Institute of Standards and Technology

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Arlene Musgrove

National Institute of Standards and Technology

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Craig J. Sansonetti

National Institute of Standards and Technology

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Daniel E. Kelleher

National Institute of Standards and Technology

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Karen J. Olsen

National Institute of Standards and Technology

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Robert A. Dragoset

National Institute of Standards and Technology

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Wolfgang L. Wiese

National Institute of Standards and Technology

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Jeffrey R. Fuhr

National Institute of Standards and Technology

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