Edward Hsia

Source drain implant during ONO formation for improved isolation of SONOS devices

Memory device and method using positive gate stress to recover overerased cell

Non-volatile memory read circuit with end of life simulation

Method of dual cell memory device operation for improved end-of-life read margin

Method of controlling program threshold voltage distribution of a dual cell memory device

Method of programming a dual cell memory device

Method of programming dual cell memory device to store multiple data states per cell

Method of programming and reading a dual cell memory device

Method of utilizing redundancy testing to substitute for main array programming and AC speed reads

Method of screening memory cells at room temperature that would be rejected during hot temperature programming tests