Edward Kintzel

Effect of temperature on the growth of ultrathin films of p-sexiphenyl on KCl(001)

Ultrathin films of p-sexiphenyl, formed by vapor-deposition onto KCl(001) substrates, have been investigated by x-ray diffraction (XRD) and atomic force microscopy (AFM). Analysis of the XRD data shows that the temperature of the alkali halide substrate during deposition affects the orientations of the molecules within the adsorbed films. AFM images contribute independent evidence consistent with the XRD results. The results are reproducible and suggest that ultrathin films of p-6P molecules can be grown with desired molecular orientations by carefully selecting the appropriate substrate temperature during deposition.

Investigation of the morphology of the initial growth of the aromatic molecule p-quaterphenyl on NaCl (001)

Investigations of the structural properties of the initial layers of p-quaterphenyl (p-4P) vapor deposited onto NaCl (001) have been carried out using atomic force microscopy (AFM), grazing incidence x-ray diffraction (GIXRD), and helium atom scattering (HAS). A series of AFM images reveal accumulations of p-4P molecules around surface defects. Film thicknesses determined from height analyses of these images are in reasonable agreement with those found using GIXRD. The GIXRD studies indicate that p-4P films vapor-deposited at ambient temperature are composed of crystallites oriented with the long molecular axis nearly perpendicular to the NaCl (001) surface. For a nominally three-monolayer film, the b axis of the crystallites appears preferentially oriented along the substrate’s [110] azimuth, but with increasing thickness the x-ray features resemble those from two-dimensional (2D) powders. The diffraction peaks found in the HAS investigation at ∼50 K for a thick film grown at ∼200 K are similarly consist...