Ehsan Nasr Esfahani

Scanning thermo-ionic microscopy for probing local electrochemistry at the nanoscale

Conventional electrochemical characterization techniques based on voltage and current measurements only probe faradaic and capacitive rates in aggregate. In this work we develop a scanning thermo-ionic microscopy (STIM) to probe local electrochemistry at the nanoscale, based on imaging of Vegard strain induced by thermal oscillation. It is demonstrated from both theoretical analysis and experimental validation that the second harmonic response of thermally induced cantilever vibration, associated with thermal expansion, is present in all solids, whereas the fourth harmonic response, caused by local transport of mobile species, is only present in ionic materials. The origin of STIM response is further confirmed by its reduced amplitude with respect to increased contact force, due to the coupling of stress to concentration of ionic species and/or electronic defects. The technique has been applied to probe Sm-doped Ceria and LiFePO4, both of which exhibit higher concentrations of mobile species near grain bo...

Touching is believing: interrogating halide perovskite solar cells at the nanoscale via scanning probe microscopy

Halide perovskite solar cells based on CH3NH3PbI3 and related materials have emerged as the most exciting development in the next generation photovoltaic technologies, yet the microscopic phenomena involving photo-carriers, ionic defects, spontaneous polarization, and molecular vibration and rotation interacting with numerous grains, grain boundaries, and interfaces are still inadequately understood. In fact, there is still need for an effective method to interrogate the local photovoltaic properties of halide perovskite solar cells that can be directly traced to their microstructures on one hand and linked to their device performance on the other hand. In this perspective, we propose that scanning probe microscopy (SPM) techniques have great potential to realize such promises at the nanoscale, and highlight some of the recent progresses and challenges along this line of investigation toward local probing of photocurrent, work function, ionic activities, polarization switching, and chemical degradation. We also emphasize the importance of multi-modality imaging, in-operando scanning, big data analysis, and multidisciplinary collaboration for further studies toward fully understanding of these complex systems.

Scanning Thermo-Ionic Microscopy: Probing Nanoscale Electrochemistry via Thermal Stress-Induced Oscillation

A universal challenge facing the development of electrochemical materials is our lack of understanding of physical and chemical processes at local length scales in 10-100 nm regime, and acquiring this understanding requires a new generation of imaging techniques. In this article, we introduce the scanning thermo-ionic microscopy (STIM) for probing local electrochemistry at the nanoscale, using for imaging the Vegard strain induced via thermal stress excitations. Since ionic oscillation is driven by the stress instead of voltage, the responses are insensitive to the electromechanical, electrostatic, and capacitive effects, and they are immune to global current perturbation, making in-operando testing possible.

Quadratic electromechanical strain in silicon investigated by scanning probe microscopy

Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and non-piezoelectric contributions measured by PFM. In this work, we systematically investigate the first and second harmonic apparent piezoresponses of a silicon wafer in both vertical and lateral modes, and we show that it exhibits an apparent electromechanical response that is quadratic to the applied electric field, possibly arising from ionic electrochemical dipoles induced by the charged probe. As a result, the electromechanical response measured is dominated by the second harmonic response in the vertical mode, and its polarity can be switched by the DC voltage with the evolving coercive field and maximum amplitude, in sharp contrast to typical ferroelectric materials we used as control. The ionic activity in silicon is also confirmed by the scanning thermo-ionic microscopy...

Multifield Control of Domains in a Room-Temperature Multiferroic 0.85BiTi0.1Fe0.8Mg0.1O3–0.15CaTiO3 Thin Film

Single-phase materials that combine electric polarization and magnetization are promising for applications in multifunctional sensors, information storage, spintronic devices, etc. Following the idea of a percolating network of magnetic ions (e.g., Fe) with strong superexchange interactions within a structural scaffold with a polar lattice, a solid solution thin film with perovskite structure at a morphotropic phase boundary with a high level of Fe atoms on the B site of perovskite structure is deposited to combine both ferroelectric and ferromagnetic ordering at room temperature with magnetoelectric coupling. In this work, a 0.85BiTi0.1Fe0.8Mg0.1O3-0.15CaTiO3 thin film has been deposited by pulsed laser deposition (PLD). Both the ferroelectricity and the magnetism were characterized at room temperature. Large polarization and a large piezoelectric effective coefficient d33 were obtained. Multifield coupling of the thin film has been characterized by scanning force microscopy. Ferroelectric domains and magnetic domains could be switched by magnetic field ( H), electric field ( E), mechanical force ( F), and, indicating that complex cross-coupling exists among the electric polarization, magnetic ordering and elastic deformation in 0.85BiTi0.1Fe0.8Mg0.1O3-0.15CaTiO3 thin film at room temperature. This work also shows the possibility of writing information with electric field, magnetic field, and mechanical force and then reading data by magnetic field. We expect that this work will benefit information applications.

Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis

Local domain structures of ferroelectrics have been studied extensively using various modes of scanning probes at the nanoscale, including piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), though none of these techniques measure the polarization directly, and the fast formation kinetics of domains and screening charges cannot be captured by these quasi-static measurements. In this study, we used charge gradient microscopy (CGM) to image ferroelectric domains of lithium niobate based on current measured during fast scanning, and applied principal component analysis (PCA) to enhance the signal-to-noise ratio of noisy raw data. We found that the CGM signal increases linearly with the scan speed while decreases with the temperature under power-law, consistent with proposed imaging mechanisms of scraping and refilling of surface charges within domains, and polarization change across domain wall. We then, based on CGM mappings, estimated the spontaneous polarization and the density of surface charges with order of magnitude agreement with literature data. The study demonstrates that PCA is a powerful method in imaging analysis of scanning probe microscopy (SPM), with which quantitative analysis of noisy raw data becomes possible.

Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data

Ever-increasing hardware capabilities and computation powers have enabled acquisition and analysis of big scientific data at the nanoscale routine, though much of the data acquired often turn out to be redundant, noisy and/or irrelevant to the problems of interest, and it remains nontrivial to draw clear mechanistic insights from pure data analytics. In this work, we use scanning probe microscopy (SPM) as an example to demonstrate deep data methodology for nanosciences, transitioning from brute-force analytics such as data mining, correlation analysis and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding. Three key ingredients of such deep data analytics are presented. A sequential excitation scanning probe microscopy (SE-SPM) technique is first developed to acquire high-quality, efficient and physically relevant data, which can be easily implemented on any standard atomic force microscope (AFM). Brute-force physical analysis is then carried out using a simple harmonic oscillator (SHO) model, enabling us to derive intrinsic electromechanical coupling of interest. Finally, principal component analysis (PCA) is carried out, which not only speeds up the analysis by four orders of magnitude, but also allows a clear physical interpretation of its modes in combination with SHO analysis. A rough piezoelectric material has been probed using such a strategy, enabling us to map its intrinsic electromechanical properties at the nanoscale with high fidelity, where conventional methods fail. The SE in combination with deep data methodology can be easily adapted for other SPM techniques to probe a wide range of functional phenomena at the nanoscale.

Scanning thermo-ionic microscopy (Conference Presentation)

Traditional electrochemical characterization microscopy methods based on charge measurement do not provide nanometer spatial resolution. The recently developed electrochemical scanning microscopy (ESM) which is based on atomic force microscopy (AFM) provides nanoscale measurements, however, the electrochemical measurements consist of other effects such as electromechanical and electrostatic effects. We developed a scanning thermo-ionic microscopy (STIM) to probe local electrochemical activities at the nanoscale regime. The microscopy mechanism is based on imaging the Vegard strain induced by thermally driven stress and temperature oscillation. The Vegard strain linearly correlates with material lattice constant and can be used as a measure of ionic species concentration. Through theoretical analysis and experimental validation, we have demonstrated that second and fourth harmonic components of the AFM deflection signal contains information about species concentration. It is demonstrated that the second harmonic response predominantly correlates with the local thermal expansion information, while the fourth harmonic one is characteristic of local transport activities that is presented only in ionic systems. All our measurements are resonance enhanced and since the tip-sample resonance varies during scanning, four lock-in units and a PID controller are integrated with the AFM to track the resonance frequency. The technique has been applied to probe Sm-doped nanocrystalline Ceria and LiFePO4, both of which exhibit higher STIM amplitude near grain boundaries as expected. The STIM is an innovative tool to study local electrochemistry with high sensitivity and spatial resolution for a wide range of systems, without any electrical cross-talk which makes it suitable to be applied in operando.

Interaction of Acoustic Solitons with Inhomogeneous Media Containing a Spherical Shape Defect

We study the interaction of one-dimensional acoustic solutions with an inhomogeneous elastic medium containing a spherical void. We investigate the influence of the in homogeneity on the reflection of incident acoustic solutions using a hybrid model consisting of finite-element and discrete element methods. The reflection of incident acoustic solutions and the time of flights of reflections are found to be dependent upon the changes in the contact interaction between the last particle and the inhomogeneous medium. Furthermore, the time of flights of the reflected acoustic solutions are sensitive to the size and the location of a void.