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Emmerich Bertagnolli

Carl Zeiss AG

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Publication

Featured researches published by Emmerich Bertagnolli.

Archive | 2008

System for processing an object

Wolfram Bühler; Alexander Rosenthal; Camille Stebler; Emmerich Bertagnolli; Heinz Wanzenböck

Archive | 2009

Method for manufacturing blade, involves activating surface area of substrate for producing protective strip, where protective strip is deposited on activated surface area by gas-phase deposition

Emmerich Bertagnolli; Wolfram Bühler; Holger Dömer; Daniel Fischer; Gottfried Hochleitner; Carl Kübler; Heinz Wanzenböck

Archive | 2010

Particle beam microscopy system and method for operating the same

Wolfram Dr Buehler; Holger Doemer; Matthias Lang; Joerg Stodolka; Peter Roediger; Emmerich Bertagnolli; Heinz Wanzenboeck

Archive | 2011

Partikelstrahl-Mikroskopiesystem und Verfahren zum Betreiben desselben

Wolfram Bühler; Holger Dömer; Matthias Lang; Jörg Stodolka; Peter Rödiger; Emmerich Bertagnolli; Heinz Wanzenböck

Archive | 2009

System zum Bearbeiten eines Objekts

Heinz Wanzenböck; Emmerich Bertagnolli; Wolfram Bühler; Camille Stebler; Rosenthal, Alexander, B.Sc.

Archive | 2008

System and Method for Processing an Object

Wolfram Bühler; Alexander Rosenthal; Emmerich Bertagnolli; Heinz Wanzenböck; Markus Fischer; Gottfried Hochleitner

Meeting Abstracts | 2006

Focused Electron Beam Induced Deposition of Silicon Oxide

Heinz Wanzenboeck; Markus Fischer; Josef Gottsbachner; Stefan Mueller; W. Brezna; Matthias Schramboeck; Emmerich Bertagnolli

PRiME 2016/230th ECS Meeting (October 2-7, 2016) | 2016

Maskless Direct-Write Etching of Nanopit Arrays in Si Using Focused Electron Beam Induced Etching

Heinz Wanzenboeck; Emmerich Bertagnolli

Archive | 2010

Teilchenstrahlmikroskopiesystem und Betriebsverfahren dafür

Wolfram Bühler; Holger Dömer; Matthias Lang; Jörg Stodolka; Peter Rödiger; Emmerich Bertagnolli; Heinz D. Wanzenböck

Archive | 2009

Partikelstrahl-Mikroskopiesystem und Verfahren zum Betreiben desselben Of the same particle beam microscopy system and method for operating

Emmerich Bertagnolli; Wolfram Bühler; Holger Dömer; Matthias Lang; Peter Rödiger; Jörg Stodolka; Heinz D. Wanzenböck

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Collaboration

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Wolfram Bühler

Carl Zeiss AG

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Alexander Rosenthal

Carl Zeiss AG

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Heinz Wanzenboeck

Carl Zeiss AG

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Camille Stebler

Carl Zeiss AG

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Gottfried Hochleitner

Carl Zeiss AG

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Heinz Wanzenböck

Carl Zeiss AG

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Heinz D. Wanzenböck

Vienna University of Technology

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Holger Dömer

Carl Zeiss AG

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Markus Fischer

Carl Zeiss AG

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Matthias Lang

Carl Zeiss AG

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