F. Matsukura

Tunnel magnetoresistance of 604% at 300K by suppression of Ta diffusion in CoFeB∕MgO∕CoFeB pseudo-spin-valves annealed at high temperature

The authors observed tunnel magnetoresistance (TMR) ratio of 604% at 300K in Ta∕Co20Fe60B20∕MgO∕Co20Fe60B20∕Ta pseudo-spin-valve magnetic tunnel junction annealed at 525°C. To obtain high TMR ratio, it was found critical to anneal the structure at high temperature above 500°C, while suppressing the Ta diffusion into CoFeB electrodes and in particular to the CoFeB∕MgO interface. X-ray diffraction measurement of MgO on SiO2 or Co20Fe60B20 shows that an improvement of MgO barrier quality, in terms of the degree of the (001) orientation and stress relaxation, takes place at annealing temperatures above 450°C. The highest TMR ratio observed at 5K was 1144%.

Current-induced domain-wall switching in a ferromagnetic semiconductor structure

Magnetic information storage relies on external magnetic fields to encode logical bits through magnetization reversal. But because the magnetic fields needed to operate ultradense storage devices are too high to generate, magnetization reversal by electrical currents is attracting much interest as a promising alternative encoding method. Indeed, spin-polarized currents can reverse the magnetization direction of nanometre-sized metallic structures through torque; however, the high current densities of 107–108 A cm-2 that are at present required exceed the threshold values tolerated by the metal interconnects of integrated circuits. Encoding magnetic information in metallic systems has also been achieved by manipulating the domain walls at the boundary between regions with different magnetization directions, but the approach again requires high current densities of about 107 A cm-2. Here we demonstrate that, in a ferromagnetic semiconductor structure, magnetization reversal through domain-wall switching can be induced in the absence of a magnetic field using current pulses with densities below 105 A cm-2. The slow switching speed and low ferromagnetic transition temperature of our current system are impractical. But provided these problems can be addressed, magnetic reversal through electric pulses with reduced current densities could provide a route to magnetic information storage applications.

Electric-field effects on thickness dependent magnetic anisotropy of sputtered MgO/Co40Fe40B20/Ta structures

We have investigated the effect of applied electric field EG on thickness dependent magnetic anisotropy of sputtered Co40Fe40B20 sandwiched with MgO and Ta. The range of CoFeB thickness explored is 2 nm and below. As the thickness is reduced, the easy axis of magnetization becomes perpendicular from in-plane. We show that perpendicular magnetic anisotropy of in-plane samples and coercivity of perpendicular samples can be modified by applying EG at room temperature. Furthermore, superparamagnetic behavior is observed for CoFeB layers with further reduced thickness below ≈0.9 nm, where electric-field effect is also observed below their blocking temperature.

Effect of electrode composition on the tunnel magnetoresistance of pseudo-spin-valve magnetic tunnel junction with a MgO tunnel barrier

The authors investigate the effect of electrode composition on the tunnel magnetoresistance (TMR) ratio of (CoxFe100−x)80B20∕MgO∕(CoxFe100−x)80B20 pseudo-spin-valve magnetic tunnel junctions (MTJs). TMR ratio is found to strongly depend on the composition and thicknesses of CoFeB. High resolution transmission electron microscopy shows that the crystallization process of CoFeB during annealing depends on the composition and the thicknesses of the CoFeB film, resulting in different TMR ratios. A TMR ratio of 500% at room temperature and of 1010% at 5K are observed in a MTJ having 4.3nm and 4-nm-thick (Co25Fe75)80B20 electrodes with a 2.1-nm-thick MgO barrier annealed at 475°C.

Electric field-induced magnetization reversal in a perpendicular-anisotropy CoFeB-MgO magnetic tunnel junction

The electric field-induced ∼180° magnetization reversal is realized for a sputtered CoFeB/MgO-based magnetic tunnel junction with perpendicular magnetic easy axis in a static external magnetic field. Application of bias voltage with nanoseconds duration results in a temporal change of magnetic easy axis in the free layer CoFeB to in-plane, which induces precessional motion of magnetization in the free layer. The magnetization reversal takes place when the bias voltage pulse duration is adjusted to a half period of the precession. We show that the back and forth magnetization reversal can be observed by using successive application of half-period voltage pulses.

2Mb Spin-Transfer Torque RAM (SPRAM) with Bit-by-Bit Bidirectional Current Write and Parallelizing-Direction Current Read

A 1.8V 2Mb spin-transfer torque RAM chip using a 0.2mum logic process with an MgO tunneling barrier cell demonstrates the circuit technologies for potential low-power non-volatile RAM, or universal memory. This chip features an array scheme with bit-by-bit bidirectional current write to achieve proper spin-transfer torque writing in 100ns, and parallelizing-direction current reading with a low-voltage bit-line that leads to 40ns access time.

Perpendicular-anisotropy CoFeB-MgO magnetic tunnel junctions with a MgO/CoFeB/Ta/CoFeB/MgO recording structure

We investigated perpendicular CoFeB-MgO magnetic tunnel junctions (MTJs) with a recording structure consisting of two CoFeB-MgO interfaces, MgO/CoFeB (1.6 nm)/Ta (0.4 nm)/CoFeB (1.0 nm)/MgO. Thermal stability factor of MTJ with the structure having junction size of 70 nmφ was increased by a factor of 1.9 from the highest value of perpendicular MTJs with single CoFeB-MgO interface having the same device structure. On the other hand, intrinsic critical current for spin transfer torque switching of the double- and single-interface MTJs was comparable.

Velocity of domain-wall motion induced by electrical current in the ferromagnetic semiconductor (Ga,Mn)As.

Current-induced domain-wall motion with velocity spanning over 5 orders of magnitude up to 22 m/s has been observed by the magneto-optical Kerr effect in (Ga,Mn)As with perpendicular magnetic anisotropy. The data are employed to verify theories of spin transfer by the Slonczewski-like mechanism as well as by the torque resulting from spin-flip transitions in the domain-wall region. Evidence for domain-wall creep at low currents is found.

Electric-field control of ferromagnetism in (Ga,Mn)As

The authors show modulation of Curie temperature TC and coercivity μ0Hc by applying external electric fields E in a ferromagnetic semiconductor (Ga,Mn)As, where a field-effect transistor structure with an Al2O3 gate insulator is utilized. Application of E=+5(–5)MV∕cm decreases (increases) TC of the channel layer. μ0Hc also decreases (increases) with increasing (decreasing) E below TC. The mechanism of the modulation of μ0Hc by E is discussed.

Nonmetal-metal-nonmetal transition and large negative magnetoresistance in (Ga, Mn)As/GaAs

Abstract We have studied magnetic and transport properties of a series of Ga 1−x Mn x As GaAs samples with different Mn concentrations (x = 0.015−0.071. For Mn content higher than about 0.02, carrier(hole)-induced ferromagnetism is observed. Samples with x = 0.035 and 0.043 behave as ferromagnetic dirty metals. With further increase of Mn content above x ∼ 0.05, the zero-field resistivity turns a semiconducting temperature dependence. Very large negative magnetoresistance is observed in non-metallic samples near the metal-nonmetal transitions both in the low and the high Mn content regimes.