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Featured researches published by Fei Yiyan.


Chinese Physics Letters | 2004

Structure, Electrical, and Optical Properties of Nb-doped BaTiO3 Thin Films Grown by Laser Molecular Beam Epitaxy

Guo Haizhong; Liu Li-Feng; Lü Hui-Bin; Fei Yiyan; Xiang Wen-Feng; Zhou Yue-Liang; Chen Zheng-Hao

Structure, electrical, and optical properties of Nb-doped BaTiO3 (Nb:BTO) thin films on MgO substrates grown by laser molecular beam epitaxy with increasing Nb content were investigated. The Nb:BTO thin films with high crystallinity are epitaxially grown on MgO substrates. With more Nb-doped content, the impurity phases are found in Nb:BTO thin films. Hall measurement at room temperature confirms that the charge carriers of the Nb:BTO thin films are n-type. When the Nb-doped content increases, the carrier concentration and carrier mobility increase. Meanwhile the optical transmittance decreases with the increase of the Nb-doping, and the width of the forbidden band in each group is not affected by the presence of Nb in the samples. Raman spectra show that the structural phase transition may occur with the increase of the Nb-doping content, in the meantime more defects and impurities exist in the Nb:BTO thin films.


Chinese Physics Letters | 2005

Unit-cell by unit-cell homoepitaxial growth using atomically flat SrTiO3(001) substrates and pulsed laser deposition

Fei Yiyan; Wang Xu; Lu Hui-Bin; Yang Guo-Zhen; Zhu Xiangdong

In-x Ga1-xN/GaN multiple quantum well (MQW) samples with strain-layer thickness lager/less than the critical one are investigated by temperature-dependent photoluminescence and transmission electron microscopy, and double crystal x-ray diffraction. For the sample with the strained-layer thickness greater than the critical thickness, we observe a high density of threading dislocations generated at the MQW layers and extended to the cap layer. These dislocations result from relaxation of the strain layer when its thickness is beyond the critical thickness. For the sample with the strained-layer thickness greater than the critical thickness, temperature-dependent photoluminescence measurements give evidence that dislocations generated from the MQW layers due to strain relaxation are main reason of the poor photoluminescence property, and the dominating status change of the main peak with increasing temperature is attributed to the change of the radiative recombination from the areas including dislocations to the ones excluding dislocations.


Chinese Physics Letters | 2003

Colossal Magnetoresistive p-n Junctions of Te-Doped LaMnO3/Nb-doped SrTiO3

Lu Hui-Bin; Dai Shouyu; Chen Zhenghao; Liu Li-Feng; Guo Haizhong; Xiang Wen-Feng; Fei Yiyan; He Meng; Zhou Yueliang; Yang Guozhen


Archive | 2004

Reflection difference device for in-situ real time detection film growth status

Fei Yiyan; Lu Huibin; Zhu Xiangdong


Archive | 2016

Method for calibrating any peak delay amount of photoelastic modulator

Zhu Chenggang; Chen Ru; Fei Yiyan


Archive | 2017

Total-reflection oblique incident light reflection difference scanning and imagining device and application method thereof

Fei Yiyan; Chen Ru; Ge Bilin; Zhu Chenggang


Archive | 2017

Oblique incident light reflection difference device based on Fourier transform

Fei Yiyan; Chen Ru; Zhu Chenggang; Ge Bilin


Archive | 2015

Full-automatic high-flux optical biosensing device

Fei Yiyan; Zhu Xiangdong; Jim Landry


Archive | 2015

Micromolecule microarray based on isocyanate and preparation method of micromolecule microarray

Fei Yiyan; Zhu Chenggang; Zhu Xiangdong


Archive | 2005

Light reflector and reflecting method for home positioning real-time detecting thin-membrane growing state

Fei Yiyan; Lu Huibin; Zhu Xiangdong

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Zhu Xiangdong

University of California

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Guo Haizhong

Chinese Academy of Sciences

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Liu Li-Feng

Chinese Academy of Sciences

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Xiang Wen-Feng

Chinese Academy of Sciences

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Lu Hui-Bin

Chinese Academy of Sciences

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Chen Zheng-Hao

Chinese Academy of Sciences

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Lü Hui-Bin

Chinese Academy of Sciences

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