Fiffamen Houndonougbo

Thin film materials characterization using TE modes cavity

This paper presents the characterization of thin film dielectric materials, labeled as LW 51 KTN and LW 48 KTN. The technique can be applied for lower temperatures. We briefly present the material process of both thin films, then the dielectric characterization using a conventional TE mode cavity method [1–5] with the help of a rigorous simulation software based on the method of lines [6]. We finally measured high permittivity and low loss-tangent materials within the microwave frequency range from 12 to 15 GHz.

Microwave study of tunable planar capacitors using mn-doped ba 0.6 sr 0.4 tio 3 ceramics

This paper deals with the microwave study of coplanar tunable capacitors using Mn-doped Ba0.6Sr0.4TiO3 ceramics. These ceramics are developed to improve performance at microwave frequencies (i.e., compromise between tuning capabilities and insertion losses). Interdigitated capacitors were first fabricated on thick Mn-doped BST ceramics. The capacitors showed reduced tuning factor because of a parasitic capacitance between the contact pads. The use of Mn-doped BST/ SiO2 bilayers led to a significant enhancement of the capacitor performance (57% of agility under 200 V at 1 GHz).