Florian Bertram

Static Magnetic Proximity Effect in Pt/NiFe2O4 and Pt/Fe Bilayers Investigated by X-Ray Resonant Magnetic Reflectivity.

The spin polarization of Pt in Pt/NiFe2O4 and Pt/Fe bilayers is studied by interface-sensitive x-ray resonant magnetic reflectivity to investigate static magnetic proximity effects. The asymmetry ratio of the reflectivity is measured at the Pt L3 absorption edge using circular polarized x-rays for opposite directions of the magnetization at room temperature. The results of the 2% asymmetry ratio for Pt/Fe bilayers are independent of the Pt thickness between 1.8 and 20 nm. By comparison with ab initio calculations, the maximum magnetic moment per spin polarized Pt atom at the interface is determined to be (0.6±0.1)  μB for Pt/Fe. For Pt/NiFe2O4 the asymmetry ratio drops below the sensitivity limit of 0.02  μB per Pt atom. Therefore, we conclude, that the longitudinal spin Seebeck effect recently observed in Pt/NiFe2O4 is not influenced by a proximity induced anomalous Nernst effect.

Ultrathin, epitaxial cerium dioxide on silicon

It is shown that ultrathin, highly ordered, continuous films of cerium dioxide may be prepared on silicon following substrate prepassivation using an atomic layer of chlorine. The as-deposited, few-nanometer-thin Ce2O3 film may very effectively be converted at room temperature to almost fully oxidized CeO2 by simple exposure to air, as demonstrated by hard X-ray photoemission spectroscopy and X-ray diffraction. This post-oxidation process essentially results in a negligible loss in film crystallinity and interface abruptness.

Reordering between tetrahedral and octahedral sites in ultrathin magnetite films grown on MgO(001)

Magnetite ultrathin films were grown using different deposition rates and substrate temperatures. The structure of these films was studied using (grazing incidence) x-ray diffraction, while their surface structure was characterized by low energy electron diffraction. In addition to that, we performed x-ray photoelectron spectroscopy and magneto optic Kerr effect measurements to probe the stoichiometry of the films as well as their magnetic properties. The diffraction peaks of the inverse spinel structure, which originate exclusively from Fe ions on tetrahedral sites are strongly affected by the preparation conditions, while the octahedral sites remain almost unchanged. With both decreasing deposition rate as well as decreasing substrate temperature, the integrated intensity of the diffraction peaks originating exclusively from Fe on tetrahedral sites is decreasing. We propose that the ions usually occupying tetrahedral sites in magnetite are relocated to octahedral vacancies. Ferrimagnetic behaviour is on...

Static magnetic proximity effect in Pt/Ni1−xFex bilayers investigated by x-ray resonant magnetic reflectivity

We present x-ray resonant magnetic reflectivity (XRMR) as a very sensitive tool to detect proximity induced interface spin polarization in Pt/FM heterostructures. Different XRMR experiments are carried out and the results are evaluated for their dependence on the magneto-optical depth profile, the photon energy, the optical parameters, and the ferromagnetic material.We demonstrate that a detailed analysis of the reflected x-ray intensity gives insight into the spatial distribution of the spin polarization of a nonmagnetic metal across the interface to a ferromagnetic layer. The evaluation of the experimental results with simulations based on optical data from ab initio calculations provides the induced magnetic moment per Pt atom in the spin-polarized volume adjacent to the ferromagnet. For a series with different ferromagnetic materials consisting of Pt/Fe, Pt/Ni33Fe67, Pt/Ni81Fe19 (permalloy), and Pt/Ni bilayers we find the largest spin polarization in Pt/Fe and a much smaller magnetic proximity effect in Pt/Ni. Additional XRMR experiments with varying photon energy are in good agreement with the theoretical predictions for the energy dependence of the magneto-optical parameters and allow identifying the optical dispersion δ and absorption β across the Pt L3-absorption edge.

Modifying magnetic properties of ultra-thin magnetite films by growth on Fe pre-covered MgO(001)

Iron oxide films were reactively grown on iron buffer films, which were deposited before on MgO(001) substrates to analyze the influence of the initial iron buffer layers on the magnetic properties of the magnetite films. X-ray photoelectron spectroscopy and low energy electron diffraction showed that magnetite films of high crystalline quality in the surface near region were formed by this two-step deposition procedure. The underlying iron film, however, was completely oxidized as proved by x-ray reflectometry and diffraction. The structural bulk quality of the iron oxide film is poor compared to magnetite films directly grown on MgO(001). Although the iron film was completely oxidized, we found drastically modified magnetic properties for these films using the magnetooptic Kerr effect. The magnetite films had strongly increased coercive fields, and their magnetic in-plane anisotropy is in-plane rotated by 45∘ compared to magnetite films formed directly by one step reactive growth on MgO(001).

Magnetic anisotropy related to strain and thickness of ultrathin iron oxide films on MgO(001)

Iron oxide films with different thicknesses (7.6?30 nm) were grown on clean MgO(001) substrates using reactive molecular beam epitaxy at 250 ?C depositing Fe in a 5 ? 10?5 mbar oxygen atmosphere. X-ray photoelectron spectra and low energy electron diffraction experiments indicate the stoichiometry and the surface structure of magnetite (Fe3O4). Film thicknesses and the lattice constants were analyzed ex situ by x-ray reflectometry and x-ray diffraction, respectively. These experiments reveal the single crystalline and epitactic state of the iron oxide films. However, the obtained vertical layer distances are too small to be strained magnetite and would rather suit to maghemite. Although Raman spectroscopy carried out to analyze the present iron oxide phase showed that the films might have slightly been oxidized in ambient conditions, a posteriori performed XPS measurements exclude a strong oxidation of the surface. Therefore we consider the presence of anti phase boundaries to explain the low vertical layer distances of the magnetite films. Further magnetooptic Kerr measurements were performed to investigate the magnetic properties. While the thinnest film shows a magnetic isotropic behavior, the thicker films exhibit a fourfold magnetic in-plane anisotropy. The magnetic easy axes are in the Fe3O4 directions. We propose that the magnetocrystalline anisotropy is too weak for very thin iron oxide films to form fourfold anisotropy related to the cubic crystal structure.

Uniaxial magnetic anisotropy for thin Co films on glass studied by magnetooptic Kerr effect

Thin Co films of different thickness deposited on glass are investigated by magnetooptic Kerr effect to study the uniaxial magnetic anisotropy of these films. The direction of the uniaxial magnetic anisotropy is determined from the azimuthal dependence of the magnetic remanence and differs with increasing thickness of the Co film investigated by x-ray reflectivity. Our experiments reveal that preparation conditions like temperature, deposition rate, or obliqueness of deposition cannot be the reason for this rotation effect of the uniaxial magnetic anisotropy. Also, strain in the substrate and possible textures in the film structure can be excluded as the origin of the magnetic behavior as studied by grazing incidence wide angle x-ray scattering. Thus, probably only the substrate shape in connection with the amorphous or polycrystalline film structure can explain the rotation of the uniaxial magnetic anisotropy.

In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy

We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy.

Fe Oxides on Ag Surfaces: Structure and Reactivity

One layer thick iron oxide films are attractive from both applied and fundamental science perspectives. The structural and chemical properties of these systems can be tuned by changing the substrate, making them promising materials for heterogeneous catalysis. In the present work, we investigate the structure of FeO(111) monolayer films grown on Ag(100) and Ag(111) substrates by means of microscopy and diffraction techniques and compare it with the structure of FeO(111) grown on other substrates reported in literature. We also study the NO adsorption properties of FeO(111)/Ag(100) and FeO(111)/Ag(111) systems utilizing different spectroscopic techniques. We discuss similarities and differences in the data obtained from adsorption experiments and compare it with previous results for FeO(111)/Pt(111).

Surface development of an aluminum brazing sheet during heating studied by XPEEM and XPS

X-ray photoelectron emission microscopy (XPEEM) was used in combination with other microscopic and spectroscopic techniques to follow the surface development of an aluminum brazing sheet during heating. The studied aluminum alloy sheet is a composite material designed for vacuum brazing. Its surface is covered with a native aluminum oxide film. Changes in the chemical state of the alloying elements and the composition of the surface layer were detected during heating to the melting temperature. It was found that Mg segregates to the surface upon heating, and the measurements indicate the formation of magnesium aluminate. During the heating the aluminum oxide as well as the silicon is observed to disappear from the surface. Our measurements is in agreement with previous studies observing a break-up of the oxide and the outflow of the braze cladding onto the surface, a process assisted by the Mg segregation and reaction with surface oxygen. This study also demonstrates how XPEEM can be utilized to study complex industrial materials.