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Dive into the research topics where François Polack is active.

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Featured researches published by François Polack.


Journal of Synchrotron Radiation | 2012

DESIRS: a state‐of‐the‐art VUV beamline featuring high resolution and variable polarization for spectroscopy and dichroism at SOLEIL

Laurent Nahon; Nelson de Oliveira; Gustavo García; Jean‐François Gil; Bertrand Pilette; Olivier Marcouillé; Bruno Lagarde; François Polack

DESIRS is a new undulator-based VUV beamline on the 2.75 GeV storage ring SOLEIL (France) optimized for gas-phase studies of molecular and electronic structures, reactivity and polarization-dependent photodynamics on model or actual systems encountered in the universe, atmosphere and biosphere. It is equipped with two dedicated endstations: a VUV Fourier-transform spectrometer (FTS) for ultra-high-resolution absorption spectroscopy (resolving power up to 10(6)) and an electron/ion imaging coincidence spectrometer. The photon characteristics necessary to fulfill its scientific mission are: high flux in the 5-40 eV range, high spectral purity, high resolution, and variable and well calibrated polarizations. The photon source is a 10 m-long pure electromagnetic variable-polarization undulator producing light from the very near UV up to 40 eV on the fundamental emission with tailored elliptical polarization allowing fully calibrated quasi-perfect horizontal, vertical and circular polarizations, as measured with an in situ VUV polarimeter with absolute polarization rates close to unity, to be obtained at the sample location. The optical design includes a beam waist allowing the implementation of a gas filter to suppress the undulator high harmonics. This harmonic-free radiation can be steered toward the FTS for absorption experiments, or go through a highly efficient pre-focusing optical system, based on a toroidal mirror and a reflective corrector plate similar to a Schmidt plate. The synchrotron radiation then enters a 6.65 m Eagle off-plane normal-incidence monochromator equipped with four gratings with different groove densities, from 200 to 4300 lines mm(-1), allowing the flux-to-resolution trade-off to be smoothly adjusted. The measured ultimate instrumental resolving powers are 124000 (174 µeV) around 21 eV and 250000 (54 µeV) around 13 eV, while the typical measured flux is in the 10(10)-10(11) photons s(-1) range in a 1/50000 bandwidth, and 10(12)-10(13) photons s(-1) in a 1/1000 bandwidth, which is very satisfactory although slightly below optical simulations. All of these features make DESIRS a state-of-the-art VUV beamline for spectroscopy and dichroism open to a broad scientific community.


Journal of The Optical Society of America A-optics Image Science and Vision | 1993

Iterative algorithms for twin-image elimination in in-line holography using finite-support constraints

Gabriel Koren; François Polack; D. Joyeux

The quality of reconstructed images from in-line holograms can be seriously degraded by the linear superposition of twin images having the same information but different foci. Starting from the reconstructed field at the real image plane, we make use of the uncontaminated information contained in the out-of-focus wave (virtual image) outside the in-focus wave (real image) support, together with a finite-support constraint, to form an iterative procedure for twin-image elimination. This algorithm can reconstruct complex objects, provided that they are not recorded in very near-field conditions. For real objects additional constraints can be imposed, extending the algorithm application to very near-field conditions. The algorithm’s convergence properties are studied in both cases, and some examples are shown.


Optics Letters | 1993

Soft-x-ray interferometer for measuring the refractive index of materials

Svatos J; D. Joyeux; Phalippou D; François Polack

We have designed and built a soft-x-ray interferometer to test the possibility of a direct measurement of the refractive index (i.e., the real part of the complex index) of materials in the soft-x-ray range. The interferometer is based on the Fresnel bimirror setup. It works near the zero path difference and requires only little spatial coherence. Plane mirrors at grazing incidence are the only optical elements. Interference fringes have been recorded at 4.8 nm, near the K edge of carbon. An index value could be obtained by measuring the fringe pattern shift between two such records, one without and one with a sample in one optical path. An estimation of the noise-limited accuracy in such an index determination shows that a few parts in 10−6 can be anticipated.


Review of Scientific Instruments | 1995

Applications of wavefront division interferometers in soft x rays

François Polack; Denis Joyeux; J. Svatoš; D. Phalippou

The development of soft x‐ray interferometry demands high quality optical elements and high brightness sources. However, the balance between these two requirements depends on the exact nature of the interferometer setups. Generally speaking, amplitude division interferometers require beam splitters, the optical quality of which remain a big technological issue. On the contrary, the high brightness sources needed by wavefront division interferometers are readily available, and will progress in the near future. Examples of such interferometers are given for various applications in development or in project.


arXiv: Instrumentation and Detectors | 2013

ANTARES, a scanning photoemission microscopy beamline at SOLEIL

José Avila; Ivy Razado-Colambo; Stehane Lorcy; Bruno Lagarde; Jean-Luc Giorgetta; François Polack; Maria C. Asensio

As one of the latest beamline built at the SOLEIL synchrotron source, ANTARES beamline offers a spectroscopic non-destructive nano-probe to study advanced materials. This innovative scanning photoemission microscopy combines linear and angle sweeps to perform precise electronic band structure determination by Nano Angle Resolved Photoelectron Spectroscopy (nanoARPES) and chemical imaging by core level detection. The beamline integrates effectively insertion devices and a high transmission beamline optics. This photon source has been combined with an advanced microscope, which has precise sample handling abilities. Moreover, it is fully compatible with a high resolution R4000 Scienta hemispherical analyzer and a set of Fresnel Zone Plates (FZP) able to focalize the beam spot up to a few tenths of nanometers, depending on the spatial resolution of the selected FZP. We present here the main conceptual design of the beamline and endstation, together with some of the firsts commissioning results.


Review of Scientific Instruments | 2014

Design and performance of AERHA, a high acceptance high resolution soft x-ray spectrometer

Sorin G. Chiuzbăian; C. F. Hague; Antoine Avila; Renaud Delaunay; N. Jaouen; Maurizio Sacchi; François Polack; Muriel Thomasset; Bruno Lagarde; Alessandro Nicolaou; Stefania Brignolo; Cédric Baumier; Jan Lüning; Jean-Michel Mariot

A soft x-ray spectrometer based on the use of an elliptical focusing mirror and a plane varied line spacing grating is described. It achieves both high resolution and high overall efficiency while remaining relatively compact. The instrument is dedicated to resonant inelastic x-ray scattering studies. We set out how this optical arrangement was judged best able to guarantee performance for the 50 - 1000 eV range within achievable fabrication targets. The AERHA (adjustable energy resolution high acceptance) spectrometer operates with an effective angular acceptance between 100 and 250 μsr (energy dependent) and a resolving power well in excess of 5000 according to the Rayleigh criterion. The high angular acceptance is obtained by means of a collecting pre-mirror. Three scattering geometries are available to enable momentum dependent measurements with 135°, 90°, and 50° scattering angles. The instrument operates on the Synchrotron SOLEIL SEXTANTS beamline which serves as a high photon flux 2 × 200 μm(2) focal spot source with full polarization control.


11TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI 2012) | 2013

The SEXTANTS beamline at SOLEIL: a new facility for elastic, inelastic and coherent scattering of soft X-rays

Maurizio Sacchi; N. Jaouen; Horia Popescu; R. Gaudemer; J. M. Tonnerre; S.G. Chiuzbaian; C. F. Hague; A. Delmotte; J. M. Dubuisson; G. Cauchon; Bruno Lagarde; François Polack

SEXTANTS is a new SOLEIL beamline dedicated to soft X-ray scattering techniques. The beamline, covering the 50-1700 eV energy range, features two Apple-II undulators for polarization control and a fixed-deviation monochromator. Two branch-lines host three end-stations for elastic, inelastic and coherent scattering experiments.


Journal of Synchrotron Radiation | 2012

DISCO synchrotron‐radiation circular‐dichroism endstation at SOLEIL

Matthieu Réfrégiers; Frank Wien; Ha-Phuong Ta; Lavanya Premvardhan; Stéphane Bac; Frédéric Jamme; Valérie Rouam; Bruno Lagarde; François Polack; Jean-Luc Giorgetta; Jean-Paul Ricaud; Michel Bordessoule; Alexandre Giuliani

The new synchrotron-radiation circular-dichroism (SRCD) endstation on the UV-visible synchrotron beamline DISCO has been commissioned at the SOLEIL synchrotron. The design has been focused on preservation of a high degree of linear polarization at high flux and moderate resolving power covering the vacuum ultraviolet to visible spectral range (125-600 nm). The beam dimensions have been set to 4 mm × 4 mm at 1 nm bandwidth for lower sample degradation. The nitrogen-purged sample chamber fits three types of sample holders accommodating conventional round cell mounting, automated rotation of the samples, as well as a microfluidic set-up. Automated temperature-controlled data collection on microvolumes is now available to the biology and chemistry communities. Macromolecules including membrane proteins, soluble proteins, bio-nanotubes, sugars, DNA and RNAs are now routinely investigated.


Journal of Synchrotron Radiation | 2015

Optical design and multi-length-scale scanning spectro-microscopy possibilities at the Nanoscopium beamline of Synchrotron Soleil

A. Somogyi; K. Medjoubi; G. Baranton; V. Le Roux; M. Ribbens; François Polack; P. Philippot; Jp Samama

The Nanoscopium 155 m-long beamline of Synchrotron Soleil is dedicated to scanning hard X-ray nanoprobe techniques. Nanoscopium aims to reach ≤100 nm resolution in the 5-20 keV energy range for routine user experiments. The beamline design tackles the tight stability requirements of such a scanning nanoprobe by creating an overfilled secondary source, implementing all horizontally reflecting main beamline optics, applying high mechanical stability equipment and constructing a dedicated high-stability building envelope. Multi-technique scanning imaging and tomography including X-ray fluorescence spectrometry and spectro-microscopy, absorption, differential phase and dark-field contrasts are implemented at the beamline in order to provide simultaneous information on the elemental distribution, speciation and sample morphology. This paper describes the optical concept and the first measured performance of the Nanoscopium beamline followed by the hierarchical length-scale multi-technique imaging experiments performed with dwell times down to 3 ms per pixel.


Journal of Synchrotron Radiation | 2011

Carbon contamination of soft X-ray beamlines: dramatic anti-reflection coating effects observed in the 1 keV photon energy region.

C. Chauvet; François Polack; Mathieu G. Silly; Bruno Lagarde; M. Thomasset; S. Kubsky; J. P. Duval; P. Risterucci; B. Pilette; I. Yao; Nicolas Bergeard; Fausto Sirotti

Carbon contamination is a general problem of under-vacuum optics submitted to high fluence. In soft X-ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K-edge (280 eV), forbidding effective measurements in this spectral region. Here the observation of strong reflectivity losses is reported related to carbon deposition at much higher energies around 1000 eV, where carbon absorptivity is small. It is shown that the observed effect can be modelled as a destructive interference from a homogeneous carbon thin film.

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Denis Joyeux

University of Paris-Sud

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Mourad Idir

University of Paris-Sud

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D. Phalippou

Centre national de la recherche scientifique

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Eric Delcamp

Centre national de la recherche scientifique

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J. C. Rodier

University of Paris-Sud

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M. Vervloet

University of Paris-Sud

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