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Featured researches published by Fu-Tien Weng.


Proceedings of SPIE | 2003

Microlens design for compact lens system

Hung-Jen Hsu; Fu-Tien Weng; Chih-Kung Chang; Yu-Kung Hsiao

This paper is about the definition and requirement of Compact lens system. One important application of the CMOS image sensor module is to capture a still image or continuous images when it is bundled with cellular phones (embedded, not add-on module). This type of application is related to the so-called “compact lens system.” We will make a description of image forming at pixel and image forming at chip and introduce the experiments of microlens shift. The discussion of the experimented results will include several factors: a) the color filter stack thickness b) the IC stack thickness c) fill factor d) the shape of photo diode. At last, check what problems may happen in actual microlens shift applications. From all above, we can understand the requirement of compact lens system.


In-line characterization, yields, reliability, and failure analysis in microelectronic manufacturing. Conference | 2001

New novel method for solving ASML alignment fail (model error) in color filter process

Fu-Tien Weng; Chung-Sheng Hsiung; Yu-Kung Hsiao; Sheng-Liang Pang; Kuo-Liang Lu

For better resolution and throughput concern on color filter process, we use ASML5500/100 for color filter production instead of 1X CANON, but it often suffered alignment fail (error code: model error) at the green layer. Some items have been studied: (1) pattern close to ASML PM mark; (2) level sensor issue (level sensor contamination, plate tilt, level lens contamination); (3) different process sequence; (4) open the clear-out window at passivation layer to reduce interference effect. All of these items are proved no obviously influence to induce model error. By checking the spectrum of the green photo-resist, we found that it is low transmittance at 633 nm1 (the wavelength that the ASML alignment laser uses). Raising the transmittance by reducing the thickness of green resist is proved useful to eliminate the occurrence of model error. On the other hand, the ATHENATM provided by ASML which use red and green lights for alignment will get rid of the alignment failure.


Archive | 2004

Effective method to improve sub-micron color filter sensitivity

Fu-Tien Weng; Yu-Kung Hsiao; Chin-Kung Chang; Hung-Jen Hsu; Yi-Ming Dai; Chin-Chen Kuo


Archive | 2006

NOVEL MICROLENS STRUCTURE FOR CIS SENSITIVITY IMPROVEMENT

Jack Deng; Chih-Kung Chang; Chin Chen Kuo; Ming-Chang Kao; Fu-Tien Weng; Bii-Junq Chang


Archive | 2005

Image sensor fabrication method and structure

Fu-Tien Weng; Yu-Kung Hsiao; Hung-Jen Hsu; Yi-Ming Dai; Chin Chen Kuo; Te-Fu Tseng; Chih-Kung Chang; Jack Deng; Chung-Sheng Hsiung; Bii-Junq Chang


Archive | 2005

Advance ridge structure for microlens gapless approach

Jack Deng; Chin Chen Kuo; Fu-Tien Weng; Chih-Kung Chang; Bii-Junq Chang


Archive | 2001

Rework procedure for the microlens element of a CMOS image sensor

Chih-Kung Chang; Kuang-Peng Lin; Yu-Kung Hsiao; Fu-Tien Weng; Bii-Junq Chang; Kuo-Liang Lu


Archive | 2000

Optoelectronic microelectronic fabrication with infrared filter and method for fabrication thereof

Yu-Kung Hsiao; Chih-Kung Chang; Fu-Tien Weng; Chung-Sheng Hsiung; Bii-Jung Chang; Kuo-Liang Lu


Archive | 2005

Microlens Structure for Image Sensors

Ming-Chang Kao; Chih-Kung Chang; Fu-Tien Weng; Bii-Junq Chang


Archive | 2006

Microlens structure for improved CMOS image sensor sensitivity

Jack Deng; Chih-Kung Chang; Chin Chen Kuo; Ming-Chang Kao; Fu-Tien Weng; Bii-Junq Chang

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