Futoshi Kanematsu

On an Intrinsic Cracking Pattern in a B-A Gauge Type Ion Source

A new method is proposed here for the derivation of mass spectrum cracking pattern, which is supposed to be possessed by ions generated in a variety of electron bombardment type ion sources used in mass spectrometry.The intrinsic cracking pattern is derived from partial ionization cross section of the sample gas with the aid of l - V distribution data of the ionizing electron, which represents the specific ionizing electron path length li of an electron having an energy of eVi. The results were applied to examine the characteristics of a cage type ion source.