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Dive into the research topics where G. Pfister-Guillouzo is active.

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Featured researches published by G. Pfister-Guillouzo.


Surface Science | 1991

XPS study of thin films of titanium oxysulfides

Danielle Gonbeau; C. Guimon; G. Pfister-Guillouzo; Alain Levasseur; G. Meunier; R. Dormoy

In this study thin films of titanium oxysulfides which could be used as positive electrode materials in microbatteries were analysed by XPS. In light of the binding energies obtained for reference compounds (different titanium oxides and Sulfides) the results have shown the existence of a new type of titanium. It presents an environment with S2−2 pairs, S2− and O2− ions, this latter in a proportion half that of sulfur ions.


Thin Solid Films | 1995

X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

L. Benoist; Danielle Gonbeau; G. Pfister-Guillouzo; E. Schmidt; G. Meunier; Alain Levasseur

In this study, new amorphous molybdenum oxysulfide thin films, prepared by r.f. magnetron sputtering and which could be used as positive electrode materials in microbatteries, were analyzed by X-ray photoelectron spectroscopy. In light of the binding energies obtained for reference compounds (different molybdenum oxides and sulfides), the results have shown the existence of several environments of molybdenum atoms. In addition to environments such as in MoO3 and MoS2, a new one has been identified; the closest neighbors of this molybdenum appear to be isolated “S2−”, disulfide “(S2)2−” ions, and “O2−” ions with the sulfur ions present in the same proportions as the oxygen ions.


Applied Surface Science | 1996

Studies of 1T TiS2 by STM, AFM and XPS: The mechanism of hydrolysis in air

Hervé Martinez; C. Auriel; Danielle Gonbeau; Michel Loudet; G. Pfister-Guillouzo

Scanning tunnelling microscopy, atomic force microscopy and X-ray photoelectron spectroscopy were used to study the surface of TiS2, a layered material. STM and AFM images in air and at room temperature revealed the trigonal symmetry of the lattice. After a few minutes exposure to air, we have shown by AFM and XPS the growth of a thin layer of TiO2 on the surface.


Journal of Electron Spectroscopy and Related Phenomena | 1997

Systematic X-ray photoelectron spectroscopy and theoretical studies of disulfides of groups IVB, VB and VIB transition metals

K. Dartigeas; L. Benoist; Danielle Gonbeau; G. Pfister-Guillouzo; G. Ouvrard; A. Levasseur

Abstract The results of a systematic study of a series of dichalcogenides MS 2 (M = Ti, Zr, Ta, Mo, W) by X-ray photoelectron spectroscopy (XPS) are reported. Variations in the S 2p binding energies and the valence band spectra are analysed. Through theoretical and experimental comparisons attempts are made to rationalize the observed variations in terms of qualitative and quantitative arguments (“real” atomic charges on sulfur atoms, specific electronic interactions).


Journal of Electron Spectroscopy and Related Phenomena | 1995

Core and valence spectra of titanium dichalcogenides TiX2 (where X is O, S). Experimental and theoretical studies

M.G. Faba; Danielle Gonbeau; G. Pfister-Guillouzo

Abstract The study of two dichalcogenides, TiO 2 and TiS 2 , by X-ray photoelectron spectroscopy is described. In addition to the experimental analysis of their core and valence spectra, two theoretical models were applied: a cluster model (MSX α ) and a periodic model (EHT-TB). With these two formalisms, the characteristics of the p ligand-d metal interactions in TiO 2 and TiS 2 have been detailed.


Journal of Electron Spectroscopy and Related Phenomena | 1974

Electronic structure of sulphur compounds VI. Photoelectron spectra of some simple thiocarbonyl compounds

C. Guimon; Danielle Gonbeau; G. Pfister-Guillouzo; Leif Åsbrink; J. Sandström

Abstract The photoelectron spectra of a number of simple thiones including thiofenchone, thiocarbonates and thioamides have been recorded, and the bands corresponding to ionization energies in the range 7.5–13 eV have been interpreted using vibrational fine structure, comparison of He-I and He-II spectra, and CNDO/S calculations. In all compounds the non-bonded orbital mostly localized on the sulphur atom has the lowest ionization potential. The position of the bonding π and σ orbitals show a marked sensitivity to the nature of the substituents on the thiocarbonyl sulphur atom.


Solid State Ionics | 1995

XPS analysis of oxido-reduction mechanisms during lithium intercalation in amorphous molybdenum oxysulfide thin films

L. Benoist; Danielle Gonbeau; G. Pfister-Guillouzo; E. Schmidt; G. Meunier; Alain Levasseur

Abstract The evolution of thin films of molybdenum oxysulfides (positive electrode material) at different stages of their cycle in experimental batteries has been studied by X-ray photoelectron spectroscopy (XPS). The main elements involved in the redox processes have been characterized: molybdenum atoms with +6 formal oxidation number and disulfide pairs S22−.


Journal of Alloys and Compounds | 1996

Electronic structure of intercalated metal disulfides (Ag13TiS2 and Fe13TiS2) studied by XPS and theoretical calculations

Hervé Martinez; Samir F. Matar; C. Auriel; Michel Loudet; G. Pfister-Guillouzo

Abstract The effect of metal intercalation (silver and iron) into lT-Cdl 2 -type TiS 2 layered crystals, expressed as M x TiS 2 , has been studied by X-ray photoelectron spectroscopy (XPS) and self-consistent electronic calculations (augmented sphere wave method). The spectra are found to depend strongly on the guest metals, and we have shown how the XPS valence bands are modified by the ‘host-guest’ interactions by using calculated densities of states. In the first approximation, the chemical shift of the core peaks are correlated with Mulliken population analysis.


Phosphorus Sulfur and Silicon and The Related Elements | 1993

Synthesis, structure and bonding properties of 3-phosphoindoles analogues of group 15

Marie-Rose Mazières; K. Rauzy; Jacques Bellan; Michel Sanchez; G. Pfister-Guillouzo; A. Senio

Abstract We present the synthesis and the characterization of new benzazadiphospholes 3, 4 and the parent compounds 5 and 6 with a P=As and a P=Sb double bond. The theoretical calculations, the photoelectron spectra and the reactivity of 2 are also discussed.


Applied Surface Science | 1997

Application of X-ray photoelectron spectroscopy to the study of degradation mechanisms of epoxy-bonded joints of zinc coated steel

M.F. Guimon; G. Pfister-Guillouzo; M. Bremont; W. Brockmann; C. Quet; J.Y. Chenard

Abstract The degradation mechanisms of bonded joints made from an electroplated-phosphated steel (EZ2) or a hot-dipped galvanized steel (G2F), and a hot-curing epoxy adhesive (1K-A) were investigated using X-ray photoelectron spectroscopy. In a first stage, the cured adhesive, the metal substrates, and the interfacial adhesive and metal sides of the fracture surfaces of unaged bonded joints were analyzed to establish the locus of failure: Adhesive for EZ2/1K-A, and cohesive for G2F/1K-A. The bonded joints were then aged following two accelerated ageing tests: The ‘cataplasme humide’ and the ‘water immersion’ tests. The Zn2p3/2 and O 1s high resolution spectrum, as well as the ZnL3M45M45 Auger peaks enabled to determine the corrosion products formed in the various zones of the fracture surfaces. The ingress of water was responsible for the total dissolution of the phosphate coating near the edges of the bonded joints for EZ2 whereas intergranular corrosion phenomena occurred on the whole metal interfacial side of G2F/1K-A bonded joints.

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Danielle Gonbeau

Centre national de la recherche scientifique

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Jean-Marc Sotiropoulos

Centre national de la recherche scientifique

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Sylvie Lacombe

Centre national de la recherche scientifique

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Anna Chrostowska

Centre national de la recherche scientifique

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C. Auriel

Centre national de la recherche scientifique

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Hervé Martinez

Centre national de la recherche scientifique

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Danièle Gonbeau

Centre national de la recherche scientifique

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Françoise Gracian

Centre national de la recherche scientifique

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