Gary L. Swoboda
Texas Instruments
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Featured researches published by Gary L. Swoboda.
IEEE Design & Test of Computers | 2008
Bart Vermeulen; Neal Stollon; Rolf Kühnis; Gary L. Swoboda; Jeff Rearick
The semiconductor industry is disaggregated, with a complex web of suppliers and consumers. Standards help to facilitate and simplify the debug process. This article provides an overview of current standardization activity. One area in need of such standardization is that of on-chip debug processes and instruments. The debug area particularly exhibits limited commonality between different IP providers in terms of interfaces and methods for complex SoCs. The problem becomes even greater with more SoC integrators using diverse IP from different vendors, requiring an increasing range of debug, analysis, and optimization capabilities. This article describes the goals and ongoing activities of five debug standardization bodies: the Nexus 5001, MIPI (Mobile Industry Processor Interface) Test and Debug, IEEE PI149.7, IEEE P1687, and OCP-IP (Open Core Protocol International Partnership) Debug working groups.
Archive | 1993
Gary L. Swoboda; Martin D. Daniels; Joseph A. Coomes
Archive | 1992
Gary L. Swoboda; Peter N. Ehlig
Archive | 2000
Gary L. Swoboda
Archive | 1996
Gary L. Swoboda
Archive | 1997
Gary L. Swoboda; Nicholas Ing-Simmons; Richard Simpson
Archive | 1996
Gary L. Swoboda; Eric J. Stotzer
Archive | 1994
Gary L. Swoboda; Mark R. Hammes; Douglas E. Deao
Archive | 2001
Gary L. Swoboda; Robert A. McGowan
Archive | 1998
Gary L. Swoboda