George B. Hopple
Canon Inc.
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by George B. Hopple.
SID Symposium Digest of Technical Papers | 2000
George B. Hopple; Christopher J. Curtin; Y. Hatano
Operating Life and Reliability are key market eligibility factors for all field emission displays. Proper faceplate, cathode and vacuum tube design as well as material and process selection are essential elements of a stable, reliable display. Discussion of the impact of these elements on life and reliability of Candescents ThinCRT technology demonstrates their importance.
Archive | 2001
William Cummings; Lawrence S. Pan; Christopher J. Spindt; George B. Hopple; Colin D. Stanners; James C. Dunphy; Shiyou Pei; Theodore S. Fahlen
Archive | 1998
Christopher J. Spindt; George B. Hopple
Archive | 1997
Theodore S. Fahlen; Alfred S. Conte; Robert M. Duboc; George B. Hopple; John K. O'reilly; Vasil M. Chakarov; Robert L. Marion; Steven T. Cho; Robert G. Neimeyer; Jennifer Y. Sun; David L. Morris; Christopher J. Spindt; Kollengode S. Narayanan
Archive | 1997
Theodore S. Fahlen; Alfred S. Conte; Robert M. Duboc; George B. Hopple; John K. O'reilly; Vasil M. Chakarov; Robert L. Marion; Steven T. Cho; Robert G. Neimeyer; Jennifer Y. Sun; David L. Morris; Christopher J. Spindt; Kollengode S. Narayanan
Archive | 2002
William Cummings; Lawrence S. Pan; Christopher J. Spindt; George B. Hopple; Colin D. Stanners; James C. Dunphy; Shiyou Pei; Theodore S. Fahlen
Archive | 1998
Roger W. Barton; Kollengode S. Narayanan; Bob L. Mackey; John M. MaCaulay; George B. Hopple; Donald R. Schropp; Michael J. Nystrom; Sudhakar Gopalakrishnan; Shiyou Pei; Xueping Xu
Archive | 1998
William C. Fritz; Igor L. Maslennikov; Robert M. Duboc; Theodore S. Fahlen; George B. Hopple
Archive | 1999
William C. Fritz; Igor L. Maslennikov; Robert M. Duboc; Theodore S. Fahlen; George B. Hopple; Christopher J. Curtin; Colin D. Stanners; Petre H. Vatahov; Christopher J. Spindt; Ronald L. Hansen
Archive | 2000
Lawrence S. Pan; Donald R. Schropp; Vasil M. Chakarov; John K. O'reilly; George B. Hopple; Christopher J. Spindt; Roger W. Barton; Michael J. Nystrom; R. Ramesh; James C. Dunphy; Shiyou Pei; Kollengode S. Narayanan