Gerard Chauvel
Texas Instruments
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Publication
Featured researches published by Gerard Chauvel.
Microelectronics Reliability | 1989
Gerard Chauvel; Jean Ciroux
Device for the testing and checking of the operation of blocks within an integrated circuit, characterized in that it is formed from a set of shift registers and logic circuits associated with each block of the circuit to be tested, the set of registers including at least one test register (35), one status register (36) and one mask register (37), the status register (36) being connected to the outputs (ST0 to ST15) of the block to be tested while the test and mask registers (35,37) and the logic circuits (38,39) are connected to a central processing unit (1) of the integrated circuit of which the blocks form part, the central processing unit (1) being also connected to the said blocks (7,10) by a common interrupt line (ΣINT).
Archive | 1997
Gerard Chauvel; Serge Lasserre; Mario Giani; Tiemen Spits; Gerard Benbassat; Frank L. Laczko; Y. Paul Chiang; Karen L. Walker; Mark E. Paley; Brian Chae
Archive | 2001
Gerard Chauvel; Dominique D'Inverno; Darvin R. Edwards
Archive | 2001
Gerard Chauvel; Dominique D'Inverno
Archive | 2001
Gerard Chauvel; Maija Kuusela; Dominique D'Inverno; Serge Lasserre
Archive | 2002
Gerard Chauvel; Dominique D'Inverno
Archive | 2002
Gerard Chauvel
Archive | 2001
Gerard Chauvel; Dominique D'Inverno; Serge Lasserre
Archive | 2002
Gerard Chauvel; Maija Kuusela; Dominique D'Inverno
Archive | 1984
Gerard Chauvel
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French Institute for Research in Computer Science and Automation
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