Glen D. Gillen

Measurement of the index of refraction of a flat zinc germanium phosphide wafer in the infrared

A method to determine the absolute refractive index of materials available in the shape of flat wafers with parallel sides by using interferometric techniques is presented. With this method, nondestructive, sample-specific measurements can be made. The method is tested by using silicon, germanium and zinc selenide, and measurements for both the ordinary and extraordinary axes of ZnGeP2 for temperatures of 300 and 77 K are reported.

Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theory

Vector diffraction theory is applied to the case of focused TEM(00) Gaussian beams passing through a spatially limiting aperture in order to investigate the propagation of these clipped focused-Gaussian beams. Beam distributions at different axial distances show that a traditional M(2) propagation model cannot be used for the propagation of clipped focus-Gaussian beams. Using Lunebergs vector diffraction theory and Fresnel approximations, an analytical model for the on-axis transverse and longitudinal electric fields and intensity distributions is presented including predictions of the maximum obtainable intensity. In addition, an analytical expression is provided for the longitudinal component of the electric field of a TEM(00) mode unperturbed Gaussian beam. Experimental results are also presented and compared to the models predictions.

Comparison of Gaussian and super Gaussian laser beams for addressing atomic qubits

Abstract We study the fidelity of single-qubit quantum gates performed with two-frequency laser fields that have a Gaussian or super Gaussian spatial mode. Numerical simulations are used to account for imperfections arising from atomic motion in an optical trap, spatially varying Stark shifts of the trapping and control beams, and transverse and axial misalignment of the control beams. Numerical results that account for the three-dimensional distribution of control light show that a super Gaussian mode with intensity

Application of Interferometric Wave Propagation for Refractive Index Measurements of Solids

I\sim \hbox {e}^{-2(r/w_0)^n}

Optical Dipole Traps for Cold Atoms using Diffracted Laser Light

I∼e-2(r/w0)n provides reduced sensitivity to atomic motion and beam misalignment. Choosing a super Gaussian with

Application of Hertz Vector Diffraction Theory to the Diffraction of Focused Gaussian Beams and Calculations of Focal Parameters

n=6