Glen M. McWright
Lawrence Livermore National Laboratory
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Publication
Featured researches published by Glen M. McWright.
Applied Physics Letters | 1984
Jackson C. Koo; Glen M. McWright; Michael D. Pocha; Russel B. Wilcox
Under high bias voltage, the leakage current through a silicon photoconductive switch is mainly caused by carrier injection at the metallic contacts. A low leakage, high voltage silicon photoconductive switch is fabricated by the introduction of carrier trap centers between the silicon substrate and metallic contacts. We report 2.5‐mm gap photoconductive switches with leakage currents of less than 50 mA at a pulse bias of 10 kV for 600 ns, and an ‘‘on’’ resistance of less than 1.3 Ω, when illustrated by a 1‐ns, 1000‐μJ pulse of 1.05‐μm radiation.
Optical Techniques for Sensing and Measurement in Hostile Environments | 1987
Frank Roeske; Don Jander; Greg Lancaster; Mark E. Lowry; Glen M. McWright; Richard T. Peterson
Integrated optics have the potential to replace conventional electronics in many instrumentation applications; in many cases the integrated-optics approach is the only one that will achieve the necessary bandwidth and information-density goals. Thus far, has been done to address the prompt hardness of these devices to intense ionizing-radiation fields. We present preliminary data on the response of optical directional coupler modulators (ODCMs) to radiation from a Febetron. The Febetron produces energetic electrons in the 300-700 keV range in tilde 3-ns FWHM pulses, with a maximum dose rate of tilde 1014 rad/s. The operation of the ODCM is monitored during and promptly after the Febetron pulse impinges the device. Long-term effets are also monitored. These data are analyzed with respect to the operation of such devipes in a harsh inonizing-radiation environment.
Hague International Symposium | 1987
Glen M. McWright; Mark E. Lowry; E. Takeuchi; G. Murphy; J. Koo; Frank Roeske
We discuss the design, fabrication, and evaluation of waveguide electro-optic modulators in gallium arsenide for application to high-speed diagnostic systems. We focus specifically on high bandwidth, single event analog modulation, and radiation susceptibility of these devices.
Review of Scientific Instruments | 1985
Glen M. McWright
This paper describes a simple method to predict the transient response of variable impedance stripline to pulse excitation. The technique uses a finite‐difference‐based quasi‐static impedance formulation to calculate the reflection coefficient at each point along the direction of pulse propagation. Excellent correlation between predictions and results obtained via time‐domain reflectometry was noted.
Electro-Optic and Magneto-Optic Materials II | 1990
Glen M. McWright; Donald A. Lafaw; Mark E. Lowry; W. Tindall
We discuss the design, fabrication, and evaluation of high speed integrated optical devices for application to photonics insirumentation systems. Specifically, we have demonstrated integrated optical devices with bandwidths in excess of 25GHz and implemented these devices in single-shot, streak camera based recording schemes.
6th Mtg in Israel on Optical Engineering | 1989
Glen M. McWright; B. Ross; W. Guthreau; D. Lafaw; Mark E. Lowry; W. Tindall
We have investigated all-optical modulators in gallium arsenide integrated optical waveguides; these modulators use electron-hole pair generation to alter the propagation characteristics of a guided light beam.
1988 International Congress on Optical Science and Engineering | 1989
Jeffrey D. Morse; Glen M. McWright; Raymond P. Mariella; Charles F. McConaghey; Elaine M. Behymer; William H. Guthreau
Thin film GaAs layers grown by Molecular Beam Epitaxy (MBE) on silicon, semi-insulating GaAs, and insulating substrates have been investigated for application to optoelectronic circuit technology. Photoconductivity measurements were conducted to characterize the electronic transport properties of the epitaxial layers in terms of carrier recombination lifetime and effective drift mobility. By varying the epitaxial growth parameters, it is possible to obtain various levels of material quality which are suitable for various components of optoelectronic integrated circuits. Results from photodetectors fabricated from GaAs grown on various layers will be presented. The fabrication of ridge waveguides from GaAs grown on silicon dioxide will also be described. Finally, a procedure for growing high quality GaAs for active devices in situ with layers for picosecond photoconductors will be discussed.
Optoelectronic Materials, Devices, Packaging, and Interconnects | 1987
Glen M. McWright; Mark E. Lowry; Frank Roeske; E. Takeuchi; G. Murphy
We discuss gallium arsenide integrated optical devices for high speed diagnostic systems. Specifically, we focus on the effect of radiation exposure on the performance characteristics of these devices.
Optoelectronic Materials, Devices, Packaging, and Interconnects II | 1989
Mark E. Lowry; Greg Lancaster; Richard T. Peterson; Glen M. McWright; Dan Nelson; Bill Kidd
1987 Symposium on the Technologies for Optoelectronics | 1988
Glen M. McWright; Mark E. Lowry; Elaine M. Behymer; W Brazes; Greg Lancaster; Frank Roeske