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Dive into the research topics where Gordon F. Williams is active.

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Featured researches published by Gordon F. Williams.


Textile Research Journal | 1986

Evolution of the Microdust and Trash Monitor for Cotton Classification

Frederick M. Shofner; Gordon F. Williams

The microdust and trash monitor (MTM) is described from early exploratory ver sions to the current fifth generation, high-speed, automated instrument for measuring foreign matter in bale or processed fiber. The MTM aeromechanically releases and separates foreign matter, classifies it, and reports its weights as percentages of lint weight.


Archive | 1999

Gin process control

Hossein M. Ghorashi; Gordon F. Williams; Mark A. Overbay


Archive | 1992

Acquisition, measurement and control of thin webs on in-process textile materials

Frederick M. Shofner; Joseph C. Baldwin; Gordon F. Williams; Mark G. Townes


Archive | 1994

Removal of undesirable entities in thin webs of textile materials

Frederick M. Shofner; Joseph C. Baldwin; Gordon F. Williams; Mark G. Townes


Archive | 1993

Needle-based apparatus for individualizing fibers and other textile entities for testing purposes

Frederick M. Shofner; Mark G. Townes; Gordon F. Williams


Archive | 1997

Fiber quality monitor

Glenn E. Irick; Luo Cheng; Youe-Tsyr Chu; Mark A. Overbay; Hossein M. Ghorashi; Michael E. Galyon; Gordon F. Williams


Archive | 1992

Apparatus and method for testing multiple characteristics of single textile sample with automatic feed

Frederick M. Shofner; Youe-T Chu; Joseph C. Baldwin; Michael E. Galyon; Benjamin M. Kacenas; Gordon F. Williams


Archive | 1998

Air curtain nep separation and detection

David B. Patelke; Gordon F. Williams; Michael E. Galyon; Hossein M. Ghorashi


Archive | 1993

Erlangen, Messung und Manipulieren dünner Faservliese bei der Verarbeitung von Textilmaterialien

Frederick M. Shofner; Joseph C. Baldwin; Gordon F. Williams; Mark G. Townes


Archive | 1993

Apparatus and method for textile sample testing

Frederick M. Shofner; Youe-T Chu; Joseph C. Baldwin; Michael E. Galyon; Benjamin M. Kacenas; Gordon F. Williams

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