H. Jönen

Auger recombination in GaInN/GaN quantum well laser structures

Nonradiative loss processes are a major concern in nitride-based light emitting devices. Utilizing optical gain measurements on GaInN/GaN/AlGaN laser structures, we have studied the dependence of the total recombination rate on excess carrier density, up to rather high densities. From a detailed quantitative analysis, we find a room-temperature Auger recombination coefficient of 1.8 ± 0.2 × 10−31 cm6/s in the bandgap range 2.5 − 3.1 eV, considerably lower than previous experimental estimates. Thus, Auger recombination is expected to be significant for laser diodes, while it is not likely to be a major factor for the droop observed in light-emitting diodes.

Strain-induced defects as nonradiative recombination centers in green-emitting GaInN/GaN quantum well structures

The origin of the green gap for GaInN/GaN quantum wells is investigated via temperature-dependent time-resolved photoluminescence spectroscopy. A strong correlation between nonradiative lifetimes and total strain energy is observed, although the wells are almost fully strained. We discuss this observation in terms of nonradiative recombination at defects which contribute to a beginning partial relaxation. The formation energy of a defect is likely reduced by the amount of its released strain energy. We therefore expect an exponential dependence of the defect density on this released strain energy. Our measured nonradiative lifetimes are consistent with a cumulative strain driven generation of defects.

Nitrogen-polar core-shell GaN light-emitting diodes grown by selective area metalorganic vapor phase epitaxy

Homogeneous nitrogen-polar GaN core-shell light emitting diode (LED) arrays were fabricated by selective area growth on patterned substrates. Transmission electron microscopy measurements prove the core-shell structure of the rod LEDs. Depending on the growth facets, the InGaN/GaN multi-quantum wells (MQWs) show different dimensions and morphology. Cathodoluminescence (CL) measurements reveal a MQWs emission centered at about 415 nm on sidewalls and another emission at 460 nm from top surfaces. CL line scans on cleaved rod also indicate the core-shell morphology. Finally, an internal quantum efficiency of about 28% at room temperature was determined by an all-optical method on a LED array.

Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography

A method for determining concentrations from high-angle annular dark field-scanning transmission electron microscopy images is presented. The method is applied to an InGaN/GaN multi-quantum well structure with high In content, as used for the fabrication of light emitting diodes and laser diodes emitting in the green spectral range. Information on specimen thickness and In concentration is extracted by comparison with multislice calculations. Resulting concentration profiles are in good agreement with a comparative atom probe tomography analysis. Indium concentrations in the quantum wells ranging from 26 at. % to 33 at. % are measured in both cases.

Highly efficient light emission from stacking faults intersecting nonpolar GaInN quantum wells

We report on the optical properties of m-plane GaInN/GaN quantum wells (QWs). We found that the emission energy of GaInN QWs grown on m-plane SiC is significantly lower than on non-polar bulk GaN, which we attribute to the high density of stacking faults. Temperature and power dependent photoluminescence reveals that the GaInN QWs on SiC have almost as large internal quantum efficiencies as on bulk GaN despite the much higher defect density. Our results indicate that quantum-wire-like features formed by stacking faults intersecting the quantum wells provide a highly efficient light emission completely dominating the optical properties of the structures.

Atomic scale investigations of ultra-thin GaInN/GaN quantum wells with high indium content

Using scanning transmission electron microscopy (STEM), we have studied ultra-thin ( 25 %) suitable for blue-green light emitting devices. We are able to analyze the QW on an atomic scale with high resolution STEM and derive the indium content quantitatively. In our analysis, we find that indium is not only incorporated into the QW but also into the barriers under certain growth conditions. We observe indium tails or even plateau-like structures in the barriers, caused by excess indium being supplied during quantum well growth.

Analysis of indium incorporation in non- and semipolar GaInN QW structures: comparing x-ray diffraction and optical properties

We have studied the growth of GaInN/GaN quantum wells on various polar, nonpolar and semipolar planes. From a detailed x-ray diffraction analysis, we derive the strain state and the composition of the quantum wells. The optical emission energy is obtained from photoluminescence spectra and modelled taking into account the deformation potentials and the Stark shifts. Both x-ray and optical data consistently show that indium incorporation is identical on the polar, nonpolar and semipolar planes within the experimental uncertainty.

Large optical polarization anisotropy due to anisotropic in-plane strain in m-plane GaInN quantum well structures grown on m-plane 6H-SiC

We investigated the optical polarization anisotropy of m-plane GaInN/GaN quantum well structures on m-plane SiC and bulk GaN substrates. On bulk GaN, the degree of polarization increases with increasing indium content according to the larger strain-induced separation of the topmost valence bands. On m-plane SiC, however, we observe constantly large polarization ratios of around 90% and more. From an x-ray strain state analysis and calculations of the valence band energies, we find that an anisotropic strain of the GaN buffer layer leads to a very strong separation of the topmost valence bands resulting in a large degree of polarization.

Effects of spontaneous polarization on GaInN/GaN quantum well structures

Using electron beam irradiation, cathodoluminescence, and photoluminescence under ultrahigh vacuum conditions, we study the effect of spontaneous polarization on polar (0001) and nonpolar (11−00) GaInN/GaN quantum well structures. We use cathodoluminescence measurements with an electron beam irradiation time of up to several hours. A drastic blueshift of the quantum well emission accompanied by a 100-fold increase of intensity is observed in polar samples. These changes can be described by an activation of the spontaneous polarization field due to the desorption of surface charges, which counteracts the piezoelectric field in the quantum well. Etching or annealing of the surface leads to similar effects. The influence of the sample structure was investigated by varying the cap thickness of the samples. A different time- dependent behavior of changes in the quantum well emission energy and the intensity depending on cap thickness and acceleration voltage was observed. This can be explained by de-screening ...

Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-contrast

In this contribution, the indium concentration profile of an InxGa1−xN/GaN five-fold multi quantum well structure is measured from high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) images. The results are compared with an atom probe tomography study. Indium concentrations in the range of 26 at.% to 33 at.% are measured in the centre of the quantum wells. An additional indium layer of 14 at.% has been found on top of the quantum wells. In the second part, the temperature dependence of measured intensities in GaN is investigated. Here, multislice calculations in the frozen lattice approximation are carried out in dependence of specimen thickness and compared to experimental data. An increase of intensity with specimen temperature is found.