Haiding Mo

Observation of surface layering in a nonmetallic liquid.

Oscillatory density profiles (layers) have previously been observed at the free surfaces of liquid metals but not in other isotropic liquids. We have used x-ray reflectivity to study a molecular liquid, tetrakis(2-ethylhexoxy)silane. When cooled to T/Tc approximately 0.25 (well above the freezing point for this liquid), density oscillations appear at the surface. Lateral order within the layers is liquidlike. Our results confirm theoretical predictions that a surface-layered state will appear even in dielectric liquids at sufficiently low temperatures, if not preempted by freezing.

Nanoscale observation of delayering in alkane films

Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point Tb in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above Tb and to a solid 3D phase on cooling below Tb. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.

Structure and Growth of Vapor-Deposited n-Dotriacontane Films Studied by X-ray Reflectivity

We have used synchrotron X-ray reflectivity measurements to investigate the structure of n-dotriacontane (n-C(32)H(66) or C32) films deposited from the vapor phase onto a SiO(2)-coated Si(100) surface. Our primary motivation was to determine whether the structure and growth mode of these films differ from those deposited from solution on the same substrate. The vapor-deposited films had a thickness of approximately 50 A thick as monitored in situ by high-resolution ellipsometry and were stable in air. Similar to the case of solution-deposited C32 films, we find that film growth in vacuum begins with a nearly complete bilayer adjacent to the SiO(2) surface formed by C32 molecules aligned with their long axis parallel to the interface followed by one or more partial layers of perpendicular molecules. These molecular layers coexist with bulk particles at higher coverages. Furthermore, after thermally cycling our vapor-deposited samples at atmospheric pressure above the bulk C32 melting point, we find the structure of our films as a function of temperature to be consistent with a phase diagram inferred previously for similarly treated solution-deposited films. Our results resolve some of the discrepancies that Basu and Satija (Basu, S.; Satija, S. K. Langmuir 2007, 23, 8331) found between the structure of vapor-deposited and solution-deposited films of intermediate-length alkanes at room temperature.

Aggregation-governed oriented growth of inorganic crystals at an organic template

X-ray studies performed during the growth of CdCO(3) and MnCO(3) crystals from supersaturated aqueous solutions, at fatty acid monolayer templates, reveal that the nucleates are nearly three-dimensional powders below a threshold supersaturation. However, at higher supersaturations, the crystals are preferentially oriented with the {0 1 2} direction vertical. Scanning electron microscope images of samples transferred to substrates show discrete crystals at low concentrations, while at higher concentrations the crystals self-aggregate to form linear chains and sheets. The authors speculate that preferential alignment at the organic-inorganic interface is enhanced as a consequence of oriented aggregation of crystals. The role of monolayer-ion interactions in governing the morphologies and the resulting orientation of the inorganic nucleate is discussed.