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Hans-Christoph Ostendorf

Infineon Technologies

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Publication

Featured researches published by Hans-Christoph Ostendorf.

Archive | 2001

Process and calibration device for testing semiconductor wafers automatically uses calibrating wafer to calibrate the device before inserting wafer to be tested

Thomas Grebner; Michael Schittenhelm; Hans-Christoph Ostendorf; Erwin Thalmann

Archive | 2002

Method for testing wafers to be tested and calibration apparatus

Thomas Grebner; Hans-Christoph Ostendorf; Michael Schittenhelm; Erwin Thalmann

Archive | 2002

Method and apparatus for calibrating a test system for an integrated semiconductor circuit

Hans-Christoph Ostendorf

Archive | 1999

Register information read out device e.g. for semiconductor chip identification

Michael Kund; Hans-Christoph Ostendorf

Archive | 2006

Integrated circuit unit e.g. memory circuit, testing device, has connecting unit for connecting tester circuit to circuit subunits, where one subunit has compression/decompression unit to exchange test and response signals between subunits

Hans-Christoph Ostendorf; Carsten Ohlhoff; Stefan Gollmer

Archive | 2006

Test apparatus and method for testing a circuit unit

Stefan Gollmer; Carsten Ohlhoff; Hans-Christoph Ostendorf

Archive | 2005

Verfahren zum Testen einer zu testenden Schaltungseinheit, welche Schaltungsuntereinheiten aufweist, und Testvorrichtung zur Durchführung des Verfahrens A method of testing a circuit under test unit having circuit subunits, and test device for carrying out the method

Hans-Christoph Ostendorf; Carsten Ohlhoff; Stefan Gollmer

Archive | 2004

Memory circuit for data storage esp. for mobile/cell phone, has control circuit for blocking and enabling read/write functions in first and second state

Hans-Christoph Ostendorf; Jürgen Zielbauer

Archive | 2001

A method for testing of wafers using a Kalibrierwafers and associated Kalibriewafer

Thomas Dr. Grebner; Hans-Christoph Ostendorf; Michael Schittenhelm; Erwin Thalmann

Archive | 2001

Verfahren zum Testen von Wafern unter Verwendung eines Kalibrierwafers und zugehöriger Kalibriewafer A method for testing of wafers using a Kalibrierwafers and associated Kalibriewafer

Thomas Dr. Grebner; Hans-Christoph Ostendorf; Michael Schittenhelm; Erwin Thalmann

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Erwin Thalmann

Infineon Technologies

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Michael Schittenhelm

Infineon Technologies

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Carsten Ohlhoff

Infineon Technologies

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Michael Kund

Infineon Technologies

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Stefan Gollmer

Infineon Technologies

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Thomas Grebner

Infineon Technologies

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Jürgen Zielbauer

Infineon Technologies

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