Hans-Christoph Ostendorf

Process and calibration device for testing semiconductor wafers automatically uses calibrating wafer to calibrate the device before inserting wafer to be tested

Method for testing wafers to be tested and calibration apparatus

Method and apparatus for calibrating a test system for an integrated semiconductor circuit

Register information read out device e.g. for semiconductor chip identification

Integrated circuit unit e.g. memory circuit, testing device, has connecting unit for connecting tester circuit to circuit subunits, where one subunit has compression/decompression unit to exchange test and response signals between subunits

Test apparatus and method for testing a circuit unit

Verfahren zum Testen einer zu testenden Schaltungseinheit, welche Schaltungsuntereinheiten aufweist, und Testvorrichtung zur Durchführung des Verfahrens A method of testing a circuit under test unit having circuit subunits, and test device for carrying out the method

Memory circuit for data storage esp. for mobile/cell phone, has control circuit for blocking and enabling read/write functions in first and second state

A method for testing of wafers using a Kalibrierwafers and associated Kalibriewafer

Verfahren zum Testen von Wafern unter Verwendung eines Kalibrierwafers und zugehöriger Kalibriewafer A method for testing of wafers using a Kalibrierwafers and associated Kalibriewafer