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Dive into the research topics where Hans Wallinga is active.

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Featured researches published by Hans Wallinga.


Journal of Applied Physics | 2000

Modeling of light-emission spectra measured on silicon nanometer-scale diode antifuses

N. Akil; V.E. Houtsma; Phuong LeMinh; J. Holleman; V. Zieren; D.B. de Mooij; P.H. Woerlee; A. van den Berg; Hans Wallinga

Electroluminescence (EL) spectra of nanoscale diodes formed after gate-oxide breakdown of n+-polysilicon/oxide/p+-substrate metal–oxide–semiconductor capacitors were measured in reverse and forward bias. The nanoscale diodes, called diode antifuses, are created by the formation of a small link between the n+-poly and the p+-substrate with the properties of a diode. A previously published multimechanism model for avalanche emission from conventional silicon p–n junctions is applied to fit the EL spectra in reverse-biased silicon-diode antifuses. The results show that the light from reverse-biased diode antifuses is caused by the same phenomena as in conventional p–n junctions. Forward-bias spectra of the diode antifuses show different shapes when lightly or highly doped p substrates are used. In the case of a lightly doped p substrate, the EL intensity in the forward mode is increased by about two orders of magnitude in the visible-wavelength range with a maximum intensity in the infrared region. A phonon-assisted electron–hole recombination model is applied to fit the low-energy part of emitted spectra. The visible emission is attributed to the Fowler–Nordheim tunneling current through the SiO2, enabled presumably by electron capture into SiO2 trap levels and intraband transition of hot electrons injected into the Si bulk.


Journal of Micromechanics and Microengineering | 2003

Novel integration of a microchannel with a silicon light emitting diode antifuse

Phuong LeMinh; J. Holleman; Hans Wallinga; Johan W. Berenschot; Niels Roelof Tas; A. van den Berg

Light emitting diode antifuses have been integrated into a microfluidic device that is realized with extended standard IC-compatible technological steps. The device comprises a microchannel sandwiched between a photodiode detector and a nanometre-scale diode antifuse light emitter. In this paper, the device fabrication process, working principle and properties and possible applications will be discussed. Changes in the interference fringe of the antifuse spectra due to the filling of the channel have been measured. Potential applications are electro-osmotic flow speed measurement, detection of absorptivity of liquids in the channel, detection of changes of the refractive index of the medium in the channel, e.g. air bubbles, particles in the liquid.


15th European Conference on Solid-State Transducers, Eurosensors XV | 2001

Photochemical Reaction by Nanometer-scale Light Emitting Diode-Antifuses

Phuong LeMinh; J. Holleman; Hans Wallinga; A. van den Berg

Silicon diode-antifuses with sizes in the nanometer range and emitting light in the visible and near ultraviolet, are employed as actuators for a photochemical process, i.e. the structure transformation of photoresist. Collective experiments were done to collect data for a correlation among exposure current, time and the size of the reaction products. A CMOS compatible integrated device with light detection capability has been realized and examined.


Journal De Physique Iv | 2001

Room temperature SiO2 films deposited by multipolar ECR PECVD

G.I. Isai; Alexeij Y. Kovalgin; J. Holleman; P.H. Woerlee; Hans Wallinga


Journal De Physique Iv | 2001

Room Temperature SiO2 films by Multipolar ECR PECVD

I.G. Isai; Alexeij Y. Kovalgin; J. Holleman; P.H. Woerlee; Hans Wallinga


Proceedings of SPIE | 2001

Novel technique for reliability testing of silicon integrated circuits

P. Le Minh; Hans Wallinga; P.H. Woerlee; A. van den Berg; J. Holleman


SAFE'99 | 1999

Characterisation of Silicon Oxide films deposited by means of ECR PECVD

Alexeij Y. Kovalgin; I.G. Isai; J. Holleman; R. Dekker; P.H. Woerlee; Hans Wallinga


Proceedings of Chemical Vapor Deposition XVI and EUROCVD 14 | 2003

Physical properties of silicon oxide layers deposited at room temperature by a combination of ECR plasma and high-speed jet of silane

I.G. Isai; Alexeij Y. Kovalgin; J. Holleman; Hans Wallinga; P.H. Woerlee; C. Cobianu; M. Modreanu


6th Symposium on Thin Film Transistor Technologies, TFTT 2002 | 2003

Electrical Properties of Room Temperature SiO2 Deposited by Combination of Jet Vapor and Multipolar Electron Cyclotron Resonance Plasma

I.G. Isai; Alexeij Y. Kovalgin; J. Holleman; P.H. Woerlee; Hans Wallinga; Yue Kuo


Archive | 2001

Thin-film Antifuses for Pellistor Type Gas Sensors

Alexeij Y. Kovalgin; J. Holleman; A. van den Berg; Hans Wallinga

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J. Holleman

MESA+ Institute for Nanotechnology

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Alexeij Y. Kovalgin

MESA+ Institute for Nanotechnology

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Albert van den Berg

MESA+ Institute for Nanotechnology

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N. Akil

University of Twente

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