Haowen Zhong

Infrared imaging diagnostics for intense pulsed electron beam

Infrared imaging diagnostic method for two-dimensional calorimetric diagnostics has been developed for intense pulsed electron beam (IPEB). By using a 100-μm-thick tungsten film as the infrared heat sink for IPEB, the emitting uniformity of the electron source can be analyzed to evaluate the efficiency and stability of the diode system. Two-dimensional axisymmetric finite element method heat transfer simulation, combined with Monte Carlo calculation, was performed for error estimation and optimization of the method. The test of the method was finished with IPEB generated by explosive emission electron diode with pulse duration (FWHM) of 80 ns, electron energy up to 450 keV, and a total beam current of over 1 kA. The results showed that it is possible to measure the cross-sectional energy density distribution of IPEB with energy sensitivity of 0.1 J/cm(2) and spatial resolution of 1 mm. The technical details, such as irradiation protection of bremsstrahlung γ photons and the functional extensibility of the method were discussed in this work.

Generation and diagnostics of pulsed intense ion beams with an energy density of 10 J/cm2

The paper presents the results of a study on transportation and focusing of a pulsed ion beam at gigawatt power level, generated by a diode with explosive-emission cathode. The experiments were carried out with the TEMP-4M accelerator operating in double-pulse mode: the first pulse is of negative polarity (500 ns, 100-150 kV), and this is followed by a second pulse of positive polarity (120 ns, 200-250 kV). To reduce the beam divergence, we modified the construction of the diode. The width of the anode was increased compared to that of the cathode. We studied different configurations of planar and focusing strip diodes. It was found that the divergence of the ion beam formed by a planar strip diode, after construction modification, does not exceed 3° (half-angle). Modification to the construction of a focusing diode made it possible to reduce the beam divergence from 8° to 4°-5°, as well as to increase the energy density at the focus up to 10-12 J/cm(2), and decrease the shot to shot variation in the energy density from 10%-15% to 5%-6%. When measuring the ion beam energy density above the ablation threshold of the target material (3.5-4 J/cm(2)), we used a metal mesh with 50% transparency to lower the energy density. The influence of the metal mesh on beam transport has been studied.