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Dive into the research topics where Harald Schneider is active.

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Featured researches published by Harald Schneider.


X-Ray Spectrometry | 1999

A tunable focusing monochromator for total reflection x-ray fluorescence spectrometers

Joachim Knoth; P. A. Beaven; C. Michaelsen; Harald Schneider; Heinrich Schwenke

The application of curved multilayer mirrors as monochromatizing and focusing elements to the primary beam of total reflection x-ray (TXRF) spectrometers is shown to be subjected to constraints which arise mainly as a result of the extended nature of the x-ray source and the low angular spread of the incident beam permissible at the target surface. If, in addition, tunability of the monochromator is required over a broad range of energy, the design of the mirrors becomes even more critical. A ray-tracing program has been developed for the optimization of the relevant parameters, such as the materials and d-spacing of the multilayer mirrors and their curvature, which takes into consideration all relevant distances and angles important for the operation of TXRF instruments. The influence of the various design parameters on the intensity at the sample spot and on the detection limits was calculated and experiments with a prototype instrument were performed in order to compare the predicted intensities and detection limits with experimental data. Copyright


Archive | 1987

Arrangement for the non-destructive measurement of metal traces

Joachim Knoth; Harald Schneider; Heinrich Schwenke


Archive | 1994

Chemical element detector for determining concn.

Joachim Knoth; Harald Schneider; Heinrich Schwenke


X-Ray Spectrometry | 1994

Tunable exciting energies for total reflection X‐ray fluorescence spectrometry using a tungsten anode and bandpass filtering

Joachim Knoth; Harald Schneider; Heinrich Schwenke


Archive | 1989

Method and arrangement for analyzing specimens pursuant to the x-ray fluorescence analysis method

Heinrich Schwenke; Joachim Knoth; Harald Schneider; Ulrich Weisbrod; Herbert Rosomm


Archive | 1986

Method for the non-destructive analysis of surface layers of samples

Joachim Knoth; Harald Schneider; Heinrich Schwenke


Archive | 1988

Process and apparatus for measuring the analysis depth in surface layers

Joachim Knoth; Harald Schneider; Heinrich Schwenke


Archive | 1989

Method and apparatus for the X-ray fluorescence analysis of samples.

Heinrich Schwenke; Joachim Knoth; Harald Schneider; Ulrich Weisbrod; Herbert Rosomm


Archive | 1987

Arrangement for non destructive measuring of metal traces

Joachim Knoth; Harald Schneider; Heinrich Schwenke


Archive | 1997

Arrangement for wavelength-dispersive analysis of fluorescence radiation from semiconductor wafer surface

Heinrich Schwenke; Joachim Knoth; Harald Schneider; Peter Dr Beaven

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