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Dive into the research topics where Harry Siebert is active.

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Featured researches published by Harry Siebert.


design, automation, and test in europe | 2005

Debug support, calibration and emulation for multiple processor and powertrain control SoCs [automotive applications]

Albrecht Mayer; Harry Siebert; Klaus D. McDonald-Maier

The introduction of complex SoCs with multiple processor cores presents new development challenges, such that development support is now a decisive factor when choosing a system-on-chip (SoC). The presented development support strategy addresses the challenges using both architecture and technology approaches. The multi-core debug support (MCDS) architecture provides flexible triggering using cross triggers and a multiple core break and suspend switch. Temporal trace ordering is guaranteed down to cycle level by on-chip time stamping. The package sized-ICE (PSI) approach is a novel method of including trace buffers, overlay memories, processing resources and communication interfaces without changing device behavior. PSI requires no external emulation box, as the debug host interfaces directly with the SoC using a standard interface.


IEEE Computer | 2007

Boosting Debugging Support for Complex Systems on Chip

Albrecht Mayer; Harry Siebert; Klaus D. McDonald-Maier

Advanced on-chip debug support can help overcome the challenges of developing real-time embedded systems driven by complex SoCs, making development support a decisive selection factor. One novel approach supports the on-time development of high-quality complex systems without greatly increasing the required design and production resources


Archive | 2007

Program code trace signature

Albrecht Mayer; Harry Siebert


Archive | 2011

Semiconductor device test system with test interface means

Harry Siebert


Archive | 2011

ARRANGEMENT FOR PROCESSING TRACE DATA INFORMATION, INTEGRATED CIRCUITS AND A METHOD FOR PROCESSING TRACE DATA INFORMATION

Albrecht Mayer; Harry Siebert


Archive | 2008

SYSTEM AND METHOD FOR TRACING INSTRUCTION POINTERS AND DATA ACCESS

Albrecht Mayer; Harry Siebert


Archive | 2007

INTEGRATED CIRCUIT HAVING A SUBORDINATE TEST INTERFACE

Albrecht Mayer; Harry Siebert


SAE 2004 World Congress & Exhibition | 2004

Embedded System Tool to Support Debugging, Calibration, Fast Prototyping and Emulation

Albrecht Mayer; Harry Siebert; Patrick Leteinturier; Alexander Qual


Archive | 2007

Device and method for electronic controlling

Jens Barrenscheen; Harry Siebert


Archive | 2009

SYSTEM FOR TESTING CONNECTIONS BETWEEN CHIPS

Jens Barrenscheen; Harry Siebert

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