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Heiner Herbst

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Archive | 1982

Two-dimensional semiconductor image sensor with regulated integration time

Rudolf Koch; Heiner Herbst

Archive | 1978

Arrangement with several thermal elements in series connection

Karl-Ulrich Stein; Heiner Herbst; Dietrich Widmann

Archive | 1979

Arrangement for color picture scanning

Heiner Herbst

Archive | 1980

Circuit with an exposure measuring unit for sensor controlled range measurement

Heiner Herbst; Hans-Joerg Dr Ing Pfleiderer; Hans-Peter Grassl

Archive | 1980

Circuit provided with an exposure measuring part for sensor-controlled telemetry

Heiner Herbst; Hans-Joerg Dr Ing Pfleiderer; Hans-Peter Grassl

Archive | 1980

Circuit for the sensor controlled distance measurement

Heiner Herbst; Hans-Jorg Pfleiderer; Hans-Peter Grassl

Archive | 1983

Two-dimensional semiconductor image sensor and method of operating the same

Heiner Herbst; Rudolf Koch

Archive | 1978

Method for producing lateral bipolar transistor by ion-implantation and controlled temperature treatment

Heiner Herbst

Archive | 1982

BIDIMENSIONAL SEMICONDUCTOR IMAGE SENSOR WITH CONTROL OR ADJUSTMENT OF THE INTEGRATION TIME

Rudolf Dr. Koch; Heiner Herbst

Archive | 1980

Readout circuit for a monolithically integrated circuit for linear image scanning

Heiner Herbst; Matthias Dipl.-Phys. Niemeyer

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