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Henri Daniel Schnurmann

IBM

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Featured researches published by Henri Daniel Schnurmann.

design automation conference | 1984

An Automated System for Testing LSI Memory Chips

Henri Daniel Schnurmann; Louis John Vidunas; Robert Michael Peters

This paper describes a software system for testing LSI memory chips. This system achieves complete automation by customizing test data for a given part number design and by creating an overall test program to be used by a computer-controlled tester in a manufacturing environment. This system encompasses DC testing of the memory product and test sites, AC testing under a variety of timing conditions, and generating a complete set of AC functional test patterns.

Archive | 1986

High performance integrated circuit packaging structure

Scott Laurence Jacobs; Perwaiz Nihal; Burhan Ozmat; Henri Daniel Schnurmann

Microelectronics Reliability | 1989

Method of partitioning, testing and diagnosing a VLSI multichip package and associated structure

Scott Laurence Jacobs; Maurice T. McMahon; Perwaiz Nihal; Burhan Ozmat; Henri Daniel Schnurmann; Arthur R. Zingher

Archive | 1982

Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test

Henri Daniel Schnurmann

Archive | 1983

Automatically testing a plurality of memory arrays on selected memory array testers

Robert Michael Peters; Henri Daniel Schnurmann; Louis John Vidunas

Microelectronics Reliability | 1991

Diagnostics of a board containing a plurality of hybrid electronic components

Edward Po-Chiu Hsieh; Maurice T. McMahon; Henri Daniel Schnurmann

Archive | 2004

Elastomeric CMOS based micro electromechanical varactor

Anil K. Chinthakindi; Henri Daniel Schnurmann

Archive | 2001

Business providing a service by cross-referencing a postal address to a location provided by a position locator

Henri Daniel Schnurmann; Louis Paul Herzberg

Archive | 1983

METHOD AND APPARATUS FOR THE AUTOMATIC TESTING OF SEMI-CONDUCTOR COMPONENTS

Henri Daniel Schnurmann

Archive | 1984

System and method for automatically testing integrated circuit memory arrays on different memory array testers.

Robert Michael Peters; Henri Daniel Schnurmann; Louis John Vidunas

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Burhan Ozmat

IBM

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Perwaiz Nihal

IBM

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Scott Laurence Jacobs

IBM

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Louis John Vidunas

IBM

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Maurice T. McMahon

IBM

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Robert Michael Peters

IBM

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Edward Po-Chiu Hsieh

IBM

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Anil K. Chinthakindi

IBM

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Arthur R. Zingher

IBM

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Louis Paul Herzberg

IBM

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