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Hideaki Sone

Fujitsu

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Publication

Featured researches published by Hideaki Sone.

Archive | 1985

Discrete fourier transformation method and apparatus for carrying out the same

Minoru Kohata; Hideaki Sone; Takashi Hamada; Tasuku Takagi; Toshito Hara; Noboru Wakatsuki

Proceedings of the Society Conference of IEICE | 2015

C-5-1 Quantitative Evaluation of Increased Inductance in Coaxial Connector with Contact Failure

Tomoya Sato; Yu-ichi Hayashi; Takaaki Mizuki; Hideaki Sone

Proceedings of the IEICE Engineering Sciences Society/NOLTA Society Conference | 2015

A-7-2 Card-Based Cryptographic Protocols Using Anomalous Shuffle

Akihiro Nishimura; Takuya Nishida; Yu-ichi Hayashi; Takaaki Mizuki; Hideaki Sone

電子情報通信学会技術研究報告. EMD, 機構デバイス | 2014

Fundamental Study on a Mechanism of Increased Inductance due to Connector Contact Failure (Electromechanical Devices : 国際セッション IS-EMD2014)

Tomoya Sato; Yu-ichi Hayashi; Takaaki Mizuki; Hideaki Sone

電気学会研究会資料. EMC, 電磁環境研究会 | 2011

A prediction method of information acquisition on electromagnetic information leakage

Taishi Ikematsu; Hayashi Yu-ichi; Takaaki Mizuki; Naofumi Homma; Hideaki Sone; Takafumi Aoki

Proceedings of the Society Conference of IEICE | 2011

B-4-58 Study on Intentional Electromagnetic Interference against Cryptographic Modules

Yu-ichi Hayashi; Naofumi Homma; Takaaki Mizuki; Takafumi Aoki; Hideaki Sone

Proceedings of the Society Conference of IEICE | 2011

B-4-59 Analysis of Information Leakage from Frequency Shifts of On-chip RC Oscillator

Masahiro Kinugawa; Yu-ichi Hayashi; Takaaki Mizuki; Hideaki Sone

電子情報通信学会技術研究報告. EMD, 機構デバイス | 2008

Computation of Electromagnetic Field Distribution in a Cross-Section of Connector with Contact Failure

Jarno Marttila; Yu-ichi Hayashi; Yoshiki Kayano; Hideaki Sone; Hiroshi Inoue

IEICE technical report. EMD | 2006

A Measurement of Contact Voltage Variation in Contacts Separating with Extremely Slow Speed

Hiroyuki Ishida; Shosuke Suzuki; Hideaki Sone; Hiroshi Inoue; Masanari Taniguchi; Tasuku Takagi

電子情報通信学会技術研究報告. EMD, 機構デバイス | 2005

Formation Mechanism of Dark Bridge between Contacts with Very Slow Opening Speed (国際セッション IS-EMD2005) -- (Contact Phenomena)

Hiroyuki Ishida; Shosuke Suzuki; Hideaki Sone; Hiroshi Inoue; Masanari Taniguchi; Tasuku Takagi

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Tasuku Takagi

Tohoku University

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Takaaki Mizuki

Tohoku University

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Yu-ichi Hayashi

Nara Institute of Science and Technology

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Masanari Taniguchi

Meijo University

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Hiroshi Inoue

The Open University of Japan

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Hiroyuki Ishida

Tohoku Bunka Gakuen University

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Naofumi Homma

Tohoku University

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Shosuke Suzuki

Tohoku Bunka Gakuen University

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Takafumi Aoki

Honeywell

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Akihiro Nishimura

Tohoku University

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