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Dive into the research topics where Hien Minh Le is active.

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Featured researches published by Hien Minh Le.


IEEE Journal of Solid-state Circuits | 2009

A 1 MB Cache Subsystem Prototype With 1.8 ns Embedded DRAMs in 45 nm SOI CMOS

Peter Juergen Klim; John E. Barth; William Robert Reohr; David Dick; Gregory J. Fredeman; Gary Koch; Hien Minh Le; Aditya Khargonekar; Pamela Wilcox; John Golz; Jente B. Kuang; Abraham Mathews; Jethro C. Law; Trong V. Luong; Hung C. Ngo; Ryan Freese; Hillery C. Hunter; Erik A. Nelson; Paul C. Parries; Toshiaki Kirihata; Subramanian S. Iyer

We describe a single voltage supply, 1 MB cache subsystem prototype that integrates 2 GHz embedded DRAM (eDRAM) macros with on-chip word-line voltage supply generation , a 4 Kb one-time-programmable read-only memory (OTPROM) for redundancy and repair control, on-chip OTPROM programming voltage generation, clock generation and distribution, array built-in self-test circuitry (ABIST), user logic and pervasive logic. The eDRAM employs a programmable pipeline, achieving 1.8 ns latency, and features concurrent refresh capability.


symposium on vlsi circuits | 2008

A one MB cache subsystem prototype with 2GHz embedded DRAMs in 45nm SOI CMOS

Peter Juergen Klim; John E. Barth; William Robert Reohr; David Dick; Gregory J. Fredeman; Gary Koch; Hien Minh Le; Aditya Khargonekar; Pamela Wilcox; John Golz; Jente B. Kuang; Abraham Mathews; Trong V. Luong; Hung Ngo; Ryan Freese; Hillery C. Hunter; Erik A. Nelson; Paul C. Parries; Toshiaki Kirihata; Subramanian S. Iyer

We present a 1 MB cache subsystem that integrates 2 GHz embedded DRAM macros, charge pump circuits, a 4 Kb one-time-programmable ROM, clock multipliers, and built-in self test circuitry, having a 36.5 GB/s peak system data-rate. The eDRAM employs a programmable pipeline, achieving a 1.8 ns latency.


Archive | 2003

Method and apparatus for implementing power-saving sleep mode in design with multiple clock domains

Yoanna Baumgartner; Sundeep Chadha; Richard Nicholas Iachetta; Hien Minh Le; Kirk Edward Morrow


Archive | 2009

Lateral castout (LCO) of victim cache line in data-invalid state

Guy Lynn Guthrie; Hien Minh Le; Alvan W. Ng; Michael Steven Siegel; Derek Edward Williams; Phillip G. Williams


Archive | 2008

Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component

Parag Birmiwal; Robert Christopher Dixon; Hien Minh Le; Kirk Edward Morrow


Archive | 2002

Unified simulation system and method for selectively including one or more cores in an integrated circuit simulation model

Maureen Terese Davis; Hien Minh Le; Anh Tran Vinh


Archive | 2007

System and method for optimizing neighboring cache usage in a multiprocessor environment

Hien Minh Le; Jason A. Cox; Robert John Dorsey; Richard Nicholas; Eric F. Robinson; Thuong Quang Truong


Archive | 2008

SERIAL TEST MODE OF AN INTEGRATED CIRCUIT (IC)

Robert Christopher Dixon; Robert Devor; Hien Minh Le; Sarah Lynn Bird


Archive | 2007

System and Method for Improved LBIST Power and Run Time

Hien Minh Le; Robert Christopher Dixon; Luis Carlos Medina; Tung Nguyen Pham


Archive | 2012

Forward progress mechanism for stores in the presence of load contention in a system favoring loads

Guy Lynn Guthrie; Hien Minh Le; Jeff A. Stuecheli; Derek Edward Williams

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