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Dive into the research topics where Hikaru Nishitani is active.

Publication


Featured researches published by Hikaru Nishitani.


Journal of The Society for Information Display | 2008

High-performance MgO thin films for PDPs with a high-rate sputtering-deposition process

Masaharu Terauchi; Jun Hashimoto; Hikaru Nishitani; Yusuke Fukui; Michiko Okafuji; Hitoshi Yamashita; Hiroshi Hayata; Takafumi Okuma; Hitoshi Yamanishi; Mikihiko Nishitani; Masatoshi Kitagawa

— A high-rate sputtering-deposition process for MgO thin films for PDP fabrication was recently developed. The deposition rate of the MgO thin film was about 300 nm/min which shows the possibility of production-line application. The MgO film deposited in this work has a higher density than that of other deposition processes such as electron-beam deposition and shows good discharge characteristics including firing voltage and discharge formation. These were achieved by controlling the stoichiometry and/or the impurity doping during the sputtering process.


13TH INTERNATIONAL CONFERENCE ON CONCENTRATOR PHOTOVOLTAIC SYSTEMS (CPV-13) | 2017

Thin concentrator photovoltaic module with micro-solar cells which are mounted by self-align method using surface tension of melted solder

Nobuhiko Hayashi; Masaharu Terauchi; Youichirou Aya; Shutetsu Kanayama; Hikaru Nishitani; Tohru Nakagawa; Michihiko Takase

We are developing a thin and lightweight CPV module using small size lens system made from poly methyl methacrylate (PMMA) with a short focal length and micro-solar cells to decrease the transporting and the installing costs of CPV systems. In order to achieve high conversion efficiency in CPV modules using micro-solar cells, the micro-solar cells need to be mounted accurately to the irradiated region of the concentrated sunlight. In this study, we have successfully developed self-align method thanks to the surface tension of the melted solder even utilizing commercially available surface-mounting technology (SMT). Solar cells were self-aligned to the specified positions of the circuit board by this self-align method with accuracy within ±10 µm. We actually fabricated CPV modules using this self-align method and demonstrated high conversion efficiency of our CPV module.


Archive | 1998

Semiconductor thin film, method of producing the same, apparatus for producing the same, semiconductor device and method of producing the same

Yoshinao Taketomi; Keizaburo Kuramasu; Masumi Izuchi; Hiroshi Satani; Hiroshi Tsutsu; Hikaru Nishitani; Mikihiko Nishitani; Masashi Goto; Yoshiko Mino


Archive | 2002

Semiconductor thin film, method and apparatus for producing the same, and semiconductor device and method of producing the same

Yoshinao Taketomi; Keizaburo Kuramasu; Masumi Izuchi; Hiroshi Satani; Hiroshi Tsutsu; Hikaru Nishitani; Mikihiko Nishitani; Masashi Goto; Yoshiko Mino


Archive | 2001

Non-single crystal film, substrate with non-single crystal film, method and apparatus for producing the same, method and apparatus for inspecting the same, thin film trasistor, thin film transistor array and image display using it

Hikaru Nishitani; Makoto Yamamoto; Yoshinao Taketomi; Shinchi Yamamoto; Masanori Miura


Archive | 2001

Semiconductor device, liquid crystal display device, EL display device, method for fabricating semiconductor thin film, and method for manufacturing the semiconductor device

Hikaru Nishitani; Makoto Yamamoto; Yoshinao Taketomi


Archive | 2001

Semiconductor device, liquid crystal display device, semicondutor film producing method, and semiconductor device producing method

Hikaru Nishitani; Makoto Yamamoto


Archive | 2003

Non-single crystal film, substrate with non-single crystal film, method and apparatus for producing the same, method and apparatus for inspecting the same, thin film transistor, thin film transistor

Hikaru Nishitani; Makoto Yamamoto; Yoshinao Taketomi


Archive | 2012

SEMICONDUCTOR THIN-FILM FORMING METHOD, SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SUBSTRATE, AND THIN-FILM SUBSTRATE

Takahiro Kawashima; Hikaru Nishitani; Sei Ootaka


Archive | 2012

CRYSTALLINITY EVALUATION METHOD, CRYSTALLINITY EVALUATION DEVICE, AND COMPUTER SOFTWARE THEREOF

Takahiro Kawashima; Genshirou Kawachi; Tomohiko Oda; Hikaru Nishitani

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