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Hiroaki Kubota

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Featured researches published by Hiroaki Kubota.

Technical report of IEICE. OPE | 2014

Degradation phenomenon of electrical contacts by a micro-sliding mechanism : The comparison of the evaluated minimal sliding amplitudes under some conditions (2)

Keiji Koshida; Shin-ichi Wada; Hiroaki Kubota; Koichiro Sawa

IEICE technical report. Speech | 2014

Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism : The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions(3) (Electromechanical Devices : 国際セッション IS-EMD2014)

Shin-ichi Wada; Keiji Koshida; Hiroaki Kubota

IEICE technical report. Speech | 2014

An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board(6)The effect by application time of external force (Electromechanical Devices : 国際セッション IS-EMD2014)

Shin-ichi Wada; Keiji Koshida; Hiroaki Kubota

IEICE technical report. Component parts and materials | 2014

Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism : The comparison of the evaluated minimal sliding amplitudes

Shin-ichi Wada; Keiji Koshida; Hiroaki Kubota; Koichiro Sawa

電子情報通信学会技術研究報告. EMD, 機構デバイス | 2012

Degradation phenomenon of electrical contacts using a hammering oscillating mechanism : A fundamental study on the performance of the oscillating mechanism (25)

Shin-ichi Wada; Keiji Koshida; Saindaa Norovling; Naoki Masuda; Akira Ishiguro; Kunio Yanagi; Hiroaki Kubota; Koichiro Sawa

IEICE Technical Report; IEICE Tech. Rep. | 2012

Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (24)

Shin-ichi Wada; Keiji Koshida; Saindaa Norovling; Naoki Masuda; Akira Ishiguro; Kunio Yanagi; Hiroaki Kubota; Koichiro Sawa

電子情報通信学会技術研究報告. EMD, 機構デバイス | 2011

Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism : Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18)

Shin-ichi Wada; Keiji Koshida; Masahiro Kawanobe; Saindaa Norovling; Naoki Masuda; Akira Ishiguro; Kunio Yanagi; Hiroaki Kubota; Koichiro Sawa

IEICE technical report. EMD | 2011

Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism : Contact Resistance (14)

Shin-ichi Wada; Saindaa Norovling; Keiji Koshida; Masahiro Kawanobe; Hiroaki Kubota; Koichiro Sawa

IEICE Technical Report; IEICE Tech. Rep. | 2011

Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19)

Shin-ichi Wada; Keiji Koshida; Saindaa Norovling; Naoki Masuda; Akira Ishiguro; Kunio Yanagi; Hiroaki Kubota; Koichiro Sawa

電子情報通信学会技術研究報告. EMD, 機構デバイス | 2010

A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism : modeling (10)

Shin-ichi Wada; Keiji Koshida; Saindaa Norovling; Masayoshi Kotabe; Hiroaki Kubota; Koichiro Sawa

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Koichiro Sawa

Chitose Institute of Science and Technology

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