Huy Thanh Vo

Device and method for repairing a semiconductor memory

Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines

Method and apparatus for testing an embedded DRAM

System for testing integrated circuit devices

Double sidewall trench capacitor cell

Method and circuit for transferring data with dynamic parity generation and checking scheme in multi-port DRAM

System and method for negative word line driver circuit

Method and apparatus for testing embedded DRAM

Memory circuit with local isolation and pre-charge circuits

Programmable data port clocking system for clocking a plurality of data ports with a plurality of clocking signals in an asynchronous transfer mode system