Hyun-Sik Chang

Progressive evolution of tunneling characteristics of in situ fabricated intrinsic Josephson junctions in Bi 2 Sr 2 CaCu 2 O 8 + δ single crystals

Stacks of a few intrinsic tunnel junctions were microfabricated on the surface of

Observation of the Andreev reflection in thec-axis transport ofBi2Sr2CaCu2O8+xsingle crystals nearTcand the search for the preformed-pair state

{\mathrm{Bi}}_{2}{\mathrm{Sr}}_{2}{\mathrm{CaCu}}_{2}{\mathrm{O}}_{8+\ensuremath{\delta}}

Collective dynamics of Josephson fluxons in Bi2Sr2CaCu2O8+δ intrinsic junctions

single crystals. The number of junctions in a stack was tailored by progressively increasing the height of the stack by ion-beam etching, while its tunneling characteristics were measured in situ in a vacuum chamber for temperatures down to

Tunneling characteristics of I- and HgI2-intercalated Bi2Sr2CaCu2O8+x single crystals

\ensuremath{\sim}13 \mathrm{K}.

Mechanism of the interlayer dissipation in Bi2Sr2CaCu2O8−x single crystals

Using this in situ etching/measurements technique in a single piece of crystal, we systematically excluded any spurious effects arising from variations in the junction parameters and made clear analysis on the following properties of the surface and inner conducting planes. First, the tunneling resistance and the current-voltage curves are scaled by the surface junction resistance. Second, we confirm that the reduction in both the gap and the superconducting transition temperature of the surface conducting plane in contact with a normal metal is not caused by the variation in the doping level, but is caused by the proximity contact. Finally, the main feature of a junction is not affected by the presence of other junctions in a stack in a low-bias region.

Dynamics of microwave-induced fluxons in HgI2-intercalated Bi2Sr2CaCu2O8+δ Josephson stacks

We observed an enhancement of the

The c-axis dissipation and vortex phases in Bi2Sr2CaCu2O8+x crystals

c

Collective motion of Josephson vortices in Bi2Sr2CaCu2O8+δ mesa structures

-axis differential conductance around the zero-bias in Au

The resistance anomaly in the surface layer of Bi2Sr2CaCu2O8+x single crystals under radio-frequency irradiation

/

Resistance enhancement of the intrinsic surface junction of Bi2Sr2CaCu2O8+x single crystal under radio-frequency irradiation

Bi