Hyun-Wook Ryu
Chonnam National University
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Publication
Featured researches published by Hyun-Wook Ryu.
Japanese Journal of Applied Physics | 2004
Hyun-Wook Ryu; Gwangpyo Choi; Gwang-Jun Hong; Jin-Seong Park
Textured crystalline NiO thin films were grown on Si(100) substrates by off-axis RF magnetron sputtering without substrate heating using a NiO target. (100)-textured NiO films were obtained using pure Ar gas. On the other hand, (111)-textured NiO films were obtained using pure O2 gas. Also, the surface morphology and roughness of the NiO thin films were closely related to the type of sputtering gas and RF power.
Japanese Journal of Applied Physics | 1999
Kyu-Seog Hwang; Hyung-Min Lee; Hyun-Wook Ryu; Yong-Mu Lim; Iwao Yamaguchi; Takaaki Manabe; Toshiya Kumagai; Susumu Mizuta
A reciprocal-space map (ω–2θ scans) can provide more information than conventional X-ray diffraction (XRD) θ–2θ scans. In this study, an epitaxial La0.5Sr0.5CoO3 thin film prepared on the SrTiO3(100) substrate by the dipping-pyrolysis (DP) process was investigated based on XRD θ–2θ scanning, β scanning (pole figure) and asymmetric ω–2θ scanning. An epitaxial La0.5Sr0.5CoO3 film annealed at 800°C was found to consist of the pseudocubic phase with a d∥/d⊥ ratio of 1.005 by reciprocal-space map analysis.
Japanese Journal of Applied Physics | 2002
Kyu-Seog Hwang; Yeon-Hum Yun; Yun-Ho Kim; Hyun-Wook Ryu; Bo-An Kang
Bi4Ti3O12 thin films were prepared on single-crystal (100)LaAlO3 substrates by chemical solution deposition using metal naphthenates as starting materials. Precursor films were pyrolyzed at 500°C for 10 min in air and finally annealed at 650, 700, 750 and 800°C for 30 min in air, followed by rapid cooling. Crystallinity and in-plane alignment of the thin films were investigated by X-ray diffraction θ–2θ scans and pole-figure analysis. A field emission-scanning electron microscope and an atomic force microscope were adopted for characterizing the surface morphology and the surface roughness of the films. Epitaxially grown thin films annealed at 650 and 700°C exhibited extremely flat surfaces. On the contrary, with the increase in annealing temperatures to 750 and 800°C, the columnar grain size and width of the films uniformly increased.
Chemistry of Natural Compounds | 2008
Sung-Han Park; Young-Rae Kim; H. G. Jang; Juhwan Kim; Hyun-Wook Ryu
305-754, Korea, fax 82 42 822 2631, e-mail: [email protected]; 2) SENOCO Co. 322-1 Dongsoo-Dong, Naju, Chonnam, 520714, Korea, Fax 82 61 336 8919, e-mail: [email protected]; 3) School of Biological Sciences and Technology, Chonnam National University, Gwangju 500-757, Korea, fax 82 62 53
Japanese Journal of Applied Physics | 2003
Kyung-Hee Park; Hyun-Wook Ryu; Yong-Jin Seo; Woo-Sun Lee; K. J. Hong; Dong-Charn Shin; Sheikh A. Akbar; Jin-Seong Park
SnO2 thin films were deposited at 375°C on an alumina substrate by metal-organic chemical vapor deposition (MOCVD). The number of hillocks on the thin-film surface increased with air annealing. The oxygen content and binding energy during air annealing at 500°C came close to those of stoichiometric SnO2. The cauliflower-like hillocks observed seem to be the result of the continuous migration of tiny grains to release the stress of an expanded grain.
Journal of Physics and Chemistry of Solids | 2007
Tae-Un Kim; D.H. Kim; Hyun-Wook Ryu; J.H. Moon; Jin-Kyu Lee; Seongjae Boo; J.H. Kim
Journal of Power Sources | 2006
Donghan Kim; Hyun-Wook Ryu; J.H. Moon; Jungmook Kim
Ceramics International | 2009
Cheol-Jae Park; Hyun-Wook Ryu; J.H. Moon; Jong-Sook Lee; Sun-Ju Song
Metals and Materials International | 2011
In-Su Jang; Ramchandra S. Kalubarme; Dong-Cheol Yang; Tae-Sin Kim; Choong-Nyeon Park; Hyun-Wook Ryu; Chan-Jin Park
Journal of the Korean Physical Society | 2003
Hyun-Wook Ryu; Kyung-Hee Park; In-Chun Kim; K. J. Hong; Woo-Sun Lee; Jin-Seong Park