I. M. Fodchuk

Structural and Photoluminescent Properties of TiN Thin Films

Structural and photoluminescent properties of TiN thin films deposited by dc reactive magnetron sputtering are studied. It is found that TiN thin films are polycrystalline with a grain size of ∼15 nm and have a NaCl-type cubic crystal structure with a lattice constant of 0.42 nm. The TiN films under study exhibit photoluminescence in the spectral range hν ≈ 2.1–3.4 eV at 300 K.

Peculiarities of MCT ion etching in rf mercury glow discharge

Results of complex investigations of n- and p-type Hg1-xCdxTe (MCT) etching in RF mercury glow discharge have been presented. Discharge was induced in quasi-closed volume. Results of technology parameter influence onto velocity of etching have been presented. It has been shown that MCT treatment by mercury ions can be carried out with etching velocity up to 30 micrometers /hour. Surface heating under these conditions slightly increases the temperature (up to 50 degree(s)C) and stoichiometry deviations are absent. It has been found that the width of disturbed layer depends on bias voltage and is smaller than 2.5 micrometers . Electrophysical parameters of n- and p-type MCT after processing have been studied. Etching of n-MCT forms the n+-n structure. The width of n+-layer corresponds to the width of disturbed zone. In the case of p-MCT, there exists inversion of conductivity type at depths exceeding those corresponding to the case of argon ions etching. It is supposed that high inversion velocity is caused by saturation of MCT surface by mercury ions during treatment.

X-ray topography of subsurface crystal layers

The practical application of the modified Berg–Barrett topographic method in a skew asymmetric scheme of X-ray diffraction is presented. The method is used for the study of the defect structure of CdTe crystals and Cd1−xHgxTe/CdTe epitaxial layers after the influence of different external factors (ion implantation and etching).

The features of anomalous multiple x-ray transmission in Ge crystals with distortions

The influence of one-dimensional distortions on the multiple effect of enhancement of anomalous x-ray transmission in a Ge crystal is considered. The distributions of intensity in transmitted and diffracted beams on an exit surface are obtained by numerical solution of the Takagi equations for three-, four- and six-beam diffraction. The correlations between the degree of blur, displacement, enhancement or decay of multiple scattering areas, on the one hand, and the type, one-dimensional strain magnitude and its direction, on the other hand, are studied.

Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction

Opportunities of multi-beam X-ray diffraction are demonstrated for determination of lattice strains in heterostructures and multi-layered systems.

X-ray moiré patterns of silicon crystals with distortions caused by local concentrated forces

We study the mechanisms of forming X-ray moiré images arising under the action of one-dimensional rows of local concentrated forces at output surface of a surface of triple-crystalline-interferometer for the cases of orientation of them parallel and perpendicular to the vector of diffraction. Presence of constant phase shift of one of the interfering waves in the interferometers analyzer results in diminishing of period, contrast and area of deformation moiré fringes. It is shown that the area of efficient interaction of phase and deformation moirés depends on both the magnitude of the constant phase shift and on the magnitude and character of arrangement of local concentrated forces in rows.

The features of x-ray topographic contrast formation in silicon with dislocation clusters

The features of formation of diffraction images of edge dislocation sets forming clusters (of two, three and more dislocations) as well as small-angle dislocation boundaries (walls) were studied. Various intensity interference effects of rescattering and internal reflection of the newly formed and already existing wave fields on thickness distributions of intensity for the case of presence in the same glide plane of edge dislocations with parallel and anti-parallel Burgers vectors were discovered.

Method of Calculation of Averaged Digital Image Profiles by Envelopes as the Conic Sections

The method of calculation of averaged digital image profiles has been developed. The image profile is dependence of the value of the pixel brightness on the image coordinate along the specified line segment. The corresponding software was developed in the MATLAB system.

The features of X-ray topographic contrast formation in silicon with dislocation clusters

The features of formation of diffraction images of edge dislocation sets forming clusters (of two, three and more dislocations) as well as small-angle dislocation boundaries (walls) have been studied. A variety of diffraction effects of wave fields created in strongly distorted crystals regions along dislocation lines have been observed. Various intensity interference effects of rescattering and internal reflection of the newly formed and already existing wave fields on thickness distributions of intensity for the case of presence in the same glide plane of edge dislocations with parallel and anti-parallel Burgers vectors were discovered.

High-dose implantation of Y2,95La0,05Fe5O12 epitaxial films by nitrogen ions

The investigations of structural changes in epitaxial films of iron-yttrium garnet (IYG) Y_2,95La_0,05Fe5O₁₂ after high dose ion implantation with nitrogen ions were performed using X-ray diffraction methods. The behaviour of structural transformations after irradiation of Y_2,95La_0,05Fe5O₁₂ crystals by the nitrogen ions was established by means of choice of the proper models of defect structure that contain several types of dominant micro defects and definitely distributed surface damaged layer. It is shown that reorganization of the crystal structure under the influence of high-doze nitrogen ion implantation leads to improved magnetic properties of Y_2,95La_0,05Fe5O₁₂ epitaxial films.