I. P. Marko

Carrier transport and recombination in p-doped and intrinsic 1.3μm InAs∕GaAs quantum-dot lasers

The radiative and nonradiative components of the threshold current in 1.3μm, p-doped and undoped quantum-dot semiconductor lasers were studied between 20 and 370K. The complex behavior can be explained by simply assuming that the radiative recombination and nonradiative Auger recombination rates are strongly modified by thermal redistribution of carriers between the dots. The large differences between the devices arise due to the trapped holes in the p-doped devices. These both greatly increase Auger recombination involving hole excitation at low temperatures and decrease electron thermal escape due to their Coulombic attraction. The model explains the high T0 values observed near room temperature.

Electrical injection Ga(AsBi)/(AlGa)As single quantum well laser

The Ga(AsBi) material system opens opportunities in the field of high efficiency infrared laser diodes. We report on the growth, structural investigations, and lasing properties of dilute bismide Ga(AsBi)/(AlGa)As single quantum well lasers with 2.2% Bi grown by metal organic vapor phase epitaxy on GaAs (001) substrates. Electrically injected laser operation at room temperature is achieved with a threshold current density of 1.56 kA/cm2 at an emission wavelength of ∼947 nm. These results from broad area devices show great promise for developing efficient IR laser diodes based on this emerging materials system.

The role of Auger recombination in InAs 1.3-/spl mu/m quantum-dot lasers investigated using high hydrostatic pressure

InAs quantum-dot (QD) lasers were investigated in the temperature range 20-300 K and under hydrostatic pressure in the range of 0-12 kbar at room temperature. The results indicate that Auger recombination is very important in 1.3-/spl mu/m QD lasers at room temperature and it is, therefore, the possible cause of the relatively low characteristic temperature observed, of T/sub 0/=41K. In the 980-nm QD lasers where T/sub 0/=110-130 K, radiative recombination dominates. The laser emission photon energy E/sub las/ increases linearly with pressure p at 10.1 and 8.3 meV/kbar for 980 nm and 1.3-/spl mu/m QD lasers, respectively. For the 980-nm QD lasers the threshold current increases with pressure at a rate proportional to the square of the photon energy E/sup 2//sub las/. However, the threshold current of the 1.3-/spl mu/m QD laser decreases by 26% over a 12-kbar pressure range. This demonstrates the presence of a nonradiative recombination contribution to the threshold current, which decreases with increasing pressure. The authors show that this nonradiative contribution is Auger recombination. The results are discussed in the framework of a theoretical model based on the electronic structure and radiative recombination calculations carried out using an 8/spl times/8 k/spl middot/p Hamiltonian.

Recombination mechanisms and band alignment of GaAs1-xBix/GaAs light emitting diodes

We investigate the temperature and pressure dependence of the light-current characteristics and electroluminescence spectra of GaAs1−xBix/GaAs light emitting diodes. The temperature dependence of the emission wavelength shows a relatively low temperature coefficient of emission peak shift of 0.19 ± 0.01 nm/K. A strong decrease in emission efficiency with increasing temperature implies that non-radiative recombination plays an important role on the performance of these devices. The pressure coefficient of the GaAs0.986Bi0.014 bandgap is measured to be 11.8 ± 0.3 meV/kbar. The electroluminescence intensity from GaAsBi is found to decrease with increasing pressure accompanied by an increase in luminescence from the GaAs cladding layers suggesting the presence of carrier leakage in the devices.

Modulation of the absorption coefficient at 1.3 μm in Ge/SiGe multiple quantum well heterostructures on silicon

We report modulation of the absorption coefficient at 1.3 μm in Ge/SiGe multiple quantum well heterostructures on silicon via the quantum-confined Stark effect. Strain engineering was exploited to increase the direct optical bandgap in the Ge quantum wells. We grew 9 nm-thick Ge quantum wells on a relaxed Si0.22Ge0.78 buffer and a contrast in the absorption coefficient of a factor of greater than 3.2 was achieved in the spectral range 1290-1315 nm.

Temperature and Bi-concentration dependence of the bandgap and spin-orbit splitting in InGaBiAs/InP semiconductors for mid-infrared applications

Replacing small amounts of As with Bi in InGaBiAs/InP induces large decreases and increases in the bandgap, Eg, and spin-orbit splitting, ΔSO, respectively. The possibility of achieving ΔSO > Eg and a reduced temperature (T) dependence for Eg are significant for suppressing recombination losses and improving performance in mid-infrared photonic devices. We measure Eg(x, T) and ΔSO (x, T) in In0.53Ga0.47BixAs1−x/InP samples for 0 ≤ x ≤ 0.039 by various complementary optical spectroscopic techniques. While we find no clear evidence of a decreased dEg/dT (≈0.34 ± 0.06 meV/K in all samples) we find ΔSO > Eg for x > 3.3–4.3%. The predictions of a valence band anti-crossing model agree well with the measurements.

Physical properties and optimization of GaBiAs/(Al)GaAs based near-infrared laser diodes grown by MOVPE with up to 4.4% Bi

This paper reports on progress in the development of GaAsBi/(Al)GaAs based lasers grown using metal-organic vapour phase epitaxy and focuses on the underlying processes governing their efficiency and temperature dependence. Room temperature lasing has been achieved in devices with 2.2% Bi and lasing in devices with 4.4% Bi was observed up to 180 K. We show that the device performance can be improved by optimizing both electrical and optical confinement in the laser structures. Analysis of the temperature dependence of the threshold current together with pure spontaneous emission and high hydrostatic pressure measurements indicate that device performance is currently dominated by non-radiative recombination through defects (>80% of the threshold current at room temperature in 2.2% Bi samples) and that to further improve the device performance and move towards longer wavelengths for optical telecommunications (1.3–1.5 µm) further effort is required to improve and optimize material quality.

Temperature dependence of the gain in p-doped and intrinsic 1.3μm InAs∕GaAs quantum dot lasers

The gain of p-doped and intrinsic InAs∕GaAs quantum dot lasers is studied at room temperature and at 350K. Our results show that, although one would theoretically expect a higher gain for a fixed carrier density in p-doped devices, due to the wider nonthermal distribution of carriers amongst the dots at T=293K, the peak net gain of the p-doped lasers is actually less at low injection than that of the undoped devices. However, at higher current densities, p doping reduces the effect of gain saturation and therefore allows ground-state lasing in shorter cavities and at higher temperatures.

Optical gain in GaAsBi/GaAs quantum well diode lasers

Optical gain, absorption and spontaneous emission spectra for GaAs_0.978Bi_0.022/GaAs laser diodes are measured experimentally and compared with theory. Internal optical losses of 10-15 cm^-1 and peak modal gain of 24 cm^-1 are measured at threshold. The results of calculations showed excellent agreement with the experiment, key for future laser design.

Temperature and pressure dependence of the recombination processes in 1.5μm InAs∕InP (311)B quantum dot lasers

The threshold current and its radiative component in 1.5μm InAs∕InP (311)B quantum dot lasers are measured as a function of the temperature. Despite an almost temperature insensitive radiative current, the threshold current increases steeply with temperature leading to a characteristic temperature T0≈55K around 290K. Direct observation of spontaneous emission from the wetting layer shows that some leakage from the dots to the wetting layer occurs in these devices. However, a decrease in the threshold current as a function of pressure is also measured suggesting that Auger recombination dominates the nonradiative current and temperature sensitivity of these devices.