I. S. Shashkin

Temperature delocalization of charge carriers in semiconductor lasers

The temperature dependences of emission characteristics are investigated for laser diodes based on asymmetric separate-confinement heterostructures with a broadened waveguide. It is established that an increase in the charge-carrier concentration in the waveguide layer is the basic mechanism of saturation in the light-current characteristic with increasing temperature in the CW mode. It is experimentally shown that the temperature delocalization of charge carriers leads to increasing internal optical losses and decreasing external differential quantum efficiency. It is shown that the degree of delocalization of charge carriers depends on the charge-carrier temperature distribution, the threshold concentration, and the quantum-well depth. The effect of thickness and energy depth of the quantum well on the temperature sensitivity of the threshold current and output optical power is considered.

Thermal delocalization of carriers in semiconductor lasers (λ = 1010–1070 nm)

The temperature dependences of the emission characteristics of semiconductor lasers based on MOVPE-grown asymmetric separate-confinement heterostructures (wavelengths λ = 1010–1070 nm) have been studied. It was found that, in the continuous-wave mode, the main mechanism of “saturation” of the light-current characteristic with increasing temperature of the active region is carrier delocalization into the waveguide layer. It was experimentally demonstrated that the thermal delocalization of carriers depends on the energy depth of the quantum well (QW) in the active region. It is shown that the minimum internal optical loss at 140°C is obtained in laser structures with the largest energy depth of the QW of the active region.

The temperature dependence of internal optical losses in semiconductor lasers (λ = 900-920 nm)

The temperature dependences of radiative characteristics of semiconductor lasers based on asymmetric heterostructures of the separate confinement with an extended waveguide fabricated by MOCVD epitaxy (the emission wavelength λ = 900–920 nm) are studied. It is established that the threshold concentration in the active region and waveguide layers of the laser heterostructure of the separate confinement increases in the CW lasing mode as the pumping current and temperature of the active region are increased. It is established experimentally that, in the temperature range of 20–140°C, the stimulated quantum yield remains unchanged. It is shown that the temperature delocalization of charge carriers leads to an increase in the carrier concentration in the waveguide layers of the laser heterostructure. The total increase in internal optical losses due to scattering by free charge carriers in the layers of the active region and waveguide layers of the laser heterostructure leads to a decrease in the differential quantum efficiency and to saturation of the watt-ampere characteristic of semiconductor lasers in the continuous lasing mode.

Temperature dependence of the threshold current density in semiconductor lasers (λ = 1050–1070 nm)

The temperature dependences of the threshold current density and threshold concentration in semiconductor lasers based on MOVPE-grown asymmetric separate-confinement heterostructures with an extended waveguide have been studied (wavelengths λ = 1050–1070). It is shown that the temperature dependence of the threshold current density in semiconductor lasers becomes markedly stronger at above-room temperatures, which is due to temperature-induced carrier delocalization into the waveguide layers of a laser heterostructure. It was found that the sharp decrease in the thermal stability of the threshold current density with increasing temperature correlates with the coincidence of the Fermi level with the conduction-band bottom of the waveguide layer in the laser heterostructure. It is experimentally demonstrated that an increase in the energy depth and number of quantum wells in the active region of a semiconductor laser improves the thermal stability of the threshold current density. It is demonstrated that the characteristic parameter T0 attains a value of 220 K in the temperature range from −20 to +70°C.

High-order diffraction gratings for high-power semiconductor lasers

A deep diffraction grating with a large period (∼2 μm) within one of the cladding layers is proposed for the implementation of selective feedback in a semiconductor laser. Frequency dependences of reflectance in the 12th diffraction order for rectangular, triangular, and trapezoidal diffraction gratings are calculated. It is shown that the maximum reflectance of the waveguide mode is attained using a rectangular or trapezoidal grating ∼2 μm deep in the laser structure. Deep trapezoidal diffraction gratings with large periods are fabricated in the Al0.3Ga0.7As cladding layer of a GaAs/AlGaAs laser structure using photolithography and reactive ion etching.

On the temperature delocalization of carriers in GaAs/AlGaAs/InGaAs quantum-well heterostructures

The effect of temperature delocalization in semiconductor lasers (emission wavelength λ = 1060 nm) based on symmetric and asymmetric separate-confinement heterostructures fabricated by metal-organic vapor-phase epitaxy (MOVPE) is studied. Experimental and calculated estimates show that the carrier concentration in the waveguide increases by an order of magnitude when the temperature of a semiconductor laser is raised by ∼100°C. It is found that an increase in the temperature of the active zone leads to enhancement of the temperature delocalization of both electrons and holes. It is shown that the delocalization of holes begins at higher temperatures, compared with that of electrons. It is demonstrated experimentally that the onset of temperature delocalization depends on the threshold carrier concentration in the active region of a laser at room temperature. It is found that raising the energy depth of the active region by choosing the waveguide material makes it possible to fully suppress the temperature-delocalization process up to 175°C.

Pulsed semiconductor lasers with higher optical strength of cavity output mirrors

Asymmetric heterostructures with an ultrathick waveguide based on an AlGaAs/GaAs alloy system that allow lasing at a wavelength of 905 nm have been developed and fabricated by hydride metalorganic vapor-phase epitaxy. The internal optical loss and internal quantum efficiency of semiconductor lasers based on such structures were 0.7 cm-1 and 97%, respectively. It is shown that the highest output optical power of laser diodes with antireflecting (SiO2) and reflecting (Si/SiO2) coatings deposited on untreated Fabry-Perot cavity facets obtained by cleaving in an oxygen atmosphere reached 67 W in the pulsed mode and is limited by mirror damage. Treatment of Fabry-Perot cavity facets by etching in argon plasma and the formation of coatings with passivating and oxygen-blocking GaN and Si3N4 layers allowed an increase in the maximum output optical power to 120 W. Mirror damage was not observed at the attained output optical power.

Study of the pulse characteristics of semiconductor lasers with a broadened waveguide at low temperatures (110–120 K)

Pulse-pumped MOVPE-fabricated (metal-organic vapor-phase epitaxy) semiconductor lasers emitting in the spectral ranges 1000–1100 and 1400–1600 nm at temperatures of 110–120 K are studied. It is found that cooling the lasers for both spectral ranges to low temperature results in their light–current curves approaching linearity, and an optical power of, respectively, 110 and 20 W can be attained. The low-temperature effect is reduced for lasers emitting in the spectral range 1400–1600 nm. The processes affecting a rise in the internal optical loss in semiconductor lasers are considered. It is shown that an increase in the carrier concentration in the waveguide of a laser structure greatly depends on temperature and is determined by the noninstantaneous capture (capture rate) of carriers from the waveguide into the active region. It is demonstrated that, upon lowering the temperature to 115K, the concentration of electrons and holes in the waveguide becomes lower, which leads to a significant decrease in the internal optical loss and to an increase in the output optical power of the semiconductor laser.

Optical-cell model based on the lasing competition of mode structures with different Q-factors in high-power semiconductor lasers

A model describing the operation of a completely optical cell, based on the competition of lasing of Fabry-Perot cavity modes and the high-Q closed mode in high-power semiconductor lasers is proposed. Based on rate equations, the conditions of lasing switching between Fabry-Perot modes for ground and excited lasing levels and the closed mode are considered in the case of increasing internal optical loss under conditions of high current pump levels. The optical-cell operation conditions in the mode of a high-power laser radiation switch (reversible mode-structure switching) and in the mode of a memory cell with bistable irreversible lasing switching between mode structures with various Q-factors are considered.

Analysis of the emission efficiency of powerful semiconductor lasers under closed-mode threshold lasing conditions

A new model describing the decrease in the emission efficiency and optical output power of a semiconductor laser above the lasing threshold of the Fabry-Perot mode is suggested. The mechanism of deterioration of the output-power characteristics is described in the suggested model in terms of the achievement of closed-mode threshold conditions. Rate equations are used to analyze how the closed-mode threshold conditions are satisfied in semiconductor lasers.