Igor V. Peidous
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Publication
Featured researches published by Igor V. Peidous.
international symposium on the physical and failure analysis of integrated circuits | 1997
Konstantin V. Loiko; Igor V. Peidous; Hok-Min Ho; E.K.B. Quek; D.H.Y. Lim
The results of studying the mechanisms of CMOS ULSI LOCOS isolation failures and an effective approach to qualifying the technological processes of isolation manufacturing are presented. The described method for reliability analysis allows one to reveal the potential capability of a current technology.
Microelectronic device technology. Conference | 1997
Konstantin V. Loiko; Igor V. Peidous; Hok-Min Ho; John F. Bromley-Barratt; Elgin T. Quek; David Hsuan Yu Lim
A method for the compensation of the narrow-width effect of local oxidation and the self-adjustment of the narrow-channel transistor threshold voltage is proposed. The method enables the significant improvement of the device characteristics and isolation performance.
Archive | 1999
Igor V. Peidous
Archive | 1999
Vladislav Vassiliev; Igor V. Peidous
Archive | 1999
Igor V. Peidous
Archive | 1998
Henry Gerung; Igor V. Peidous; Thomas Schuelke; Andrew Kuswatno
Archive | 1997
Igor V. Peidous
Archive | 1998
Igor V. Peidous
Archive | 1998
Igor V. Peidous
Archive | 2000
Igor V. Peidous; Quek Elgin; Konstantin V. Loiko; Tan Poh Suan; Vijai Kumar Chhagan
Collaboration
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