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Ito Yoshiyasu

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Publication

Featured researches published by Ito Yoshiyasu.

Archive | 2006

METHOD OF MEASURING DEAD TIME IN X-RAY DETECTOR

Ueda Tomoyasu; Ito Yoshiyasu; Omote Kazuhiko

Archive | 2005

MEMBRANE STRUCTURAL ANALYSIS METHOD AND APPARATUS OF THE SAME

Ito Yoshiyasu; Omote Kazuhiko

Archive | 2004

ANALYSIS METHOD USING PROPAGATION LINE, AND APPARATUS FOR THE SAME

Omote Kazuhiko; Sasaki Akito; Ito Yoshiyasu

Archive | 2017

X-RAY THIN FILM INSPECTION DEVICE

Ogata Kiyoshi; Yoshihara Sei; Kinefuchi Takao; Umegaki Shiro; Asano Shigematsu; Horada Katsutaka; Yoshida Muneo; Motono Hiroshi; Takahashi Hideaki; Higuchi Akifusa; Omote Kazuhiko; Ito Yoshiyasu; Kawahara Naoki; Nakano Asao

Archive | 2005

METHOD AND APPARATUS FOR ANALYZING FILM STRUCTURE

Ito Yoshiyasu; Omote Kazuhiko

Archive | 2018

X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND METHOD FOR MEASURING ROCKING CURVE

Ogata Kiyoshi; Omote Kazuhiko; Yoshihara Sei; Ito Yoshiyasu; Motono Hiroshi; Takahashi Hideaki; Kinefuchi Takao; Higuchi Akifusa; Umegaki Shiro; Asano Shigematsu; Yamaguchi Ryotaro; Horada Katsutaka; Kambe Makoto; Jiang Licai; Verman Boris

Archive | 2018

COMBINED INSPECTION SYSTEM

Ogata Kiyoshi; 尾形 潔; Omote Kazuhiko; 表 和彦; Ito Yoshiyasu; 伊藤 義泰

Archive | 2016

X-ray thin film inspection apparatus

Ogata Kiyoshi; Yoshihara Sei; Kinefuchi Takao; Umegaki Shiro; Asano Shigematsu; Horada Katsutaka; Yoshida Muneo; Motono Hiroshi; Takahashi Hideaki; Higuchi Akifusa; Omote Kazuhiko; Ito Yoshiyasu; Kawahara Naoki; Nakano Asao

Archive | 2015

A surface fine structure measuring method, a surface fine structure measuring program and a surface microstructure measurement system

Omote Kazuhiko; Ito Yoshiyasu

Archive | 2012

Verfahren zur Messung einer Oberflächenmikrostruktur, Verfahren zur Datenanalyse einer Oberflächenmikrostrukturmessung undRöntgenstreuungs-Messeinrichtung

Omote Kazuhiko; Ito Yoshiyasu

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Ogata Kiyoshi

Hitachi

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Nakano Asao

Hitachi

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