Ivan Kassamakov

Scanning white-light interferometry with a supercontinuum source

A supercontinuum light source was incorporated into a custom-built scanning white-light interferometer. This light source based on a Nd:YAG pumped microstructured optical fiber exhibits 1.21+/-0.10 microm temporal coherence length. The device operation was validated by characterizing the step height on a microelectromechanical system component. The measured step height- 7.027+/-0.020 microm-agreed with results obtained by employing traditional light sources: a halogen lamp and a white light-emitting diode. The new light source features high output intensity of 20-35 mW, which is beneficial when measuring low-reflectivity samples. As the supercontinuum light source may be modulated at frequencies exceeding 10 MHz, it holds potential for stroboscopic dynamic measurements.

Effects of activation by proton irradiation on silicon particle detector electric characteristics

After irradiation with 7 and 9 MeV protons, activation-induced effects were encountered in measurements of current-voltage (IV) and capacitance-voltage (CV) characteristics for Czochralski and float-zone grown silicon particle detectors prepared on printed circuit boards with copper electrodes. With the present detector construction, the S30i(p,n)P30 and C63u(p,n)Z63n reactions induce dominant interference in such measurements. The daughter nuclides are positron emitters with half-lives of 2.5 and 38.5 min, respectively, and the slowing down of the emitted positrons generates a significantly large concentration of electron-hole pairs in the detector volume increasing the leakage current level and decreasing the breakdown voltage. The observed time-dependent characteristics were verified by modeling the activation of the detector structure and the resulting leakage current. As a result, the electrical measurements cannot be performed immediately after irradiation due to silicon activation, and, generally, ...

Breakdown of silicon particle detectors under proton irradiation

Silicon particle detectors made on Czochralski and float zone silicon materials were irradiated with 7 and 9 MeV protons at a temperature of 220 K. During the irradiations, the detectors were biased up to their operating voltage. Specific values for the fluence and flux of the irradiation were found to cause a sudden breakdown in the detectors. We studied the limits of the fluence and the flux in the breakdown as well as the behavior of the detector response function under high flux irradiations. The breakdown was shown to be an edge effect. Additionally, the buildup of an oxide charge is suggested to lead to an increased localized electric field, which in turn triggers a charge carrier multiplication. Furthermore, we studied the influences of the type of silicon material and the configuration of the detector guard rings.

Nanometer depth resolution in 3D topographic analysis of drug-loaded nanofibrous mats without sample preparation.

We showed that scanning white light interferometry (SWLI) can provide nanometer depth resolution in 3D topographic analysis of electrospun drug-loaded nanofibrous mats without sample preparation. The method permits rapidly investigating geometric properties (e.g. fiber diameter, orientation and morphology) and surface topography of drug-loaded nanofibers and nanomats. Electrospun nanofibers of a model drug, piroxicam (PRX), and hydroxypropyl methylcellulose (HPMC) were imaged. Scanning electron microscopy (SEM) served as a reference method. SWLI 3D images featuring 29 nm by 29 nm active pixel size were obtained of a 55 μm × 40 μm area. The thickness of the drug-loaded non-woven nanomats was uniform, ranging from 2.0 μm to 3.0 μm (SWLI), and independent of the ratio between HPMC and PRX. The average diameters (n=100, SEM) for drug-loaded nanofibers were 387 ± 125 nm (HPMC and PRX 1:1), 407 ± 144 nm (HPMC and PRX 1:2), and 290 ± 100 nm (HPMC and PRX 1:4). We found advantages and limitations in both techniques. SWLI permits rapid non-contacting and non-destructive characterization of layer orientation, layer thickness, porosity, and surface morphology of electrospun drug-loaded nanofibers and nanomats. Such analysis is important because the surface topography affects the performance of nanomats in pharmaceutical and biomedical applications.

Czochralski Silicon as a Detector Material for S-LHC Tracker Volumes

Abstract With an expected 10-fold increase in luminosity in S-LHC, the radiation environment in the tracker volumes will be considerably harsher for silicon-based detectors than the already harsh LHC environment. Since 2006, a group of CMS institutes, using a modified CMS DAQ system, has been exploring the use of Magnetic Czochralski silicon as a detector element for the strip tracker layers in S-LHC experiments. Both p+/n-/n+ and n+/p-/p+ sensors have been characterized, irradiated with proton and neutron sources, assembled into modules, and tested in a CERN beamline. There have been three beam studies to date and results from these suggest that both p+/n-/n+ and n+/p-/p+ Magnetic Czochralski silicon are sufficiently radiation hard for the R > 25 cm regions of S-LHC tracker volumes. The group has also explored the use of forward biasing for heavily irradiated detectors, and although this mode requires sensor temperatures less than −50xa0°C, the charge collection efficiency appears to be promising.

Scratch resistance of plasticized hydroxypropyl methylcellulose (HPMC) films intended for tablet coatings

Scratch resistance (SR) of externally plasticized hydroxypropyl methylcellulose (HPMC) films intended for tablet film coatings was studied. Special attention was paid to effects of short-term aging and ultraviolet (UV) treatment on the SR properties of these films. Controlled scratching of the films was performed with a Lloyd LRX materials tester featuring a spherical steel tip. Scratch surface profiles were measured by scanning white light interferometry (SWLI). The influence of using an external plasticizer on the SR was studied by comparing scratch dimensions in non-plasticized films to samples plasticized either with glycerol or polyethylene glycol (PEG) 400. The study demonstrates that both the amount and type of plasticizer influences the SR of aqueous HPMC films. It also shows that SWLI can quantitatively evaluate the effect of plasticizer content and aging on the SR of pharmaceutical films. This knowledge could be used to optimize pharmaceutical film coating formulations.

Concurrent structural and mechanical characterization of forming colloidal film by ultrasound and light

We combined noninvasive ultrasonic and optical measurements to estimate the mechanical properties of forming colloidal films. Light reflection measurements determined the stage of drying and film structure. A concurrent ultrasound measurement quantified the film stiffness. The main finding was that compressing capillary forces induced a temporal peak in film stiffness when air began to enter the pores in the film. We believe that empirically observing such a stiffening event has not been reported before. This finding advances the understanding of the physics of consolidating suspensions.

Characterization of Ni/SnPb-TiW/Pt Flip Chip Interconnections in Silicon Pixel Detector Modules

In contemporary high energy physics experiments, silicon detectors are essential for recording the trajectory of new particles generated by multiple simultaneous collisions. Modern particle tracking systems may feature 100 million channels, or pixels, which need to be individually connected to read-out chains. Silicon pixel detectors are typically connected to readout chips by flip-chip bonding using solder bumps.

Scanning White Light Interferometry for Optical Scanner Calibration using GEM-foil based Traceable Standard

Gas Electron Multiplier (GEM) detectors record particle trajectories in colliders. GEM characterization is important during manufacturing and final testing. We established a traceable method to calibrate our Optical Scanning System employed for quality control of GEM foils.

CSI HELSINKI: SWLI IN FORENSIC SCIENCE: COMPARING TOOLMARKS OF DIAGONAL CUTTING PLIERS

Scanning White Light Interferometry provides sub‐micron depth resolution and is therefore an ideal data acquisition method for forensic toolmark comparison in which such resolution is required. We imaged toolmarks made on ten copper wires with a preselected part of the jaws of a pair of diagonal cutting pliers. The common pattern found in the surface depth profiles comparison indicated a common source. The application of white light interferometry provides a quantitative method for forensic toolmark study through high‐resolution 3D profiles.