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J.A.A. Engelbrecht

Nelson Mandela Metropolitan University

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Publication

Featured researches published by J.A.A. Engelbrecht.

conference on lasers and electro optics | 2013

Characterization of Boron Nitride thin films

Mikhail Chubarov; Henrik Pedersen; Hans Högberg; Stanislav Filippov; J.A.A. Engelbrecht; J. O'Connel; Anne Henry

Rhombohedral Boron Nitride layers were grown on sapphire substrate in a hot-wall CVD reactor. The characterization of those layers is reported and the results are discussed in correlation with the various growth parameters used.

Physica B-condensed Matter | 2014

Boron nitride: A new photonic material

Mikhail Chubarov; Henrik Pedersen; Hans Högberg; Stanislav Filippov; J.A.A. Engelbrecht; J. O'Connel; Anne Henry

Physica B-condensed Matter | 2011

The influence of various dielectric parameters on the reststrahlen region of SiC

J.A.A. Engelbrecht; I.J. van Rooyen

Physica B-condensed Matter | 2007

The apparent effect of sample surface damage on the dielectric parameters of GaAs

J.A.A. Engelbrecht; N.G. Hashe; K.T. Hillie; C.H. Claassens

Physica B-condensed Matter | 2012

The origin of a peak in the reststrahlen region of SiC

J.A.A. Engelbrecht; I.J. van Rooyen; Anne Henry; Erik Janzén; E.J. Olivier

Infrared Physics & Technology | 2015

Notes on the plasma resonance peak employed to determine doping in SiC

J.A.A. Engelbrecht; I.J. van Rooyen; Anne Henry; Erik Janzén; B. Sephton

Journal of Nuclear Materials | 2012

The effect of grain size and phosphorous-doping of polycrystalline 3C–SiC on infrared reflectance spectra

I.J. van Rooyen; J.A.A. Engelbrecht; Anne Henry; Erik Janzén; J.H. Neethling; P.M. van Rooyen

Physica B-condensed Matter | 2016

An alternative method to determine the refractive index of AlxGa1−xN

J.A.A. Engelbrecht; B. Sephton; E.G. Minnaar; M.C. Wagener

Physica B-condensed Matter | 2014

Impact of dielectric parameters on the reflectivity of 3C–SiC wafers with a rough surface morphology in the reststrahlen region

J.A.A. Engelbrecht; Erik Janzén; Anne Henry; I.J. van Rooyen

Physica B-condensed Matter | 2009

Characterization of InSb layers on GaAs substrates using infrared reflectance and a modified oscillator formula

J.A.A. Engelbrecht; M.C. Wagener

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Collaboration

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Anne Henry

Linköping University

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I.J. van Rooyen

Idaho National Laboratory

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Erik Janzén

Linköping University

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B. Sephton

Nelson Mandela Metropolitan University

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E.G. Minnaar

Nelson Mandela Metropolitan University

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J. O'Connel

Nelson Mandela Metropolitan University

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M.C. Wagener

Nelson Mandela Metropolitan University

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Hans Högberg

Linköping University

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Henrik Pedersen

Linköping University

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Mikhail Chubarov

Linköping University

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