J. Briaire
Eindhoven University of Technology
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Publication
Featured researches published by J. Briaire.
Journal of Applied Physics | 1998
J. Briaire; L.K.J. Vandamme
The ensemble average and variance of Gaussian noise measured as cross-correlation spectra are calculated as a function of the number of time averages. The calculations are based on the Carson–Campbell theorem which treats noise spectra as a collection of individual deterministic pulses transformed into the frequency domain. We have compared our calculations with experimental results on metal film resistors. There is an excellent agreement between the predicted and the measured statistical behavior.
Journal of Magnetism and Magnetic Materials | 1997
M. A. M. Gijs; J.B. Giesbers; P. Beliën; J. W. van Est; J. Briaire; L.K.J. Vandamme
We have investigated the room temperature 1/f noise of microstructured soft magnetic Ni80Fe20 films, showing the anisotropic magnetoresistance effect, and of Ni80Fe20/Cu magnetic multilayers, showing the giant magnetoresistance effect. We find that the 1/f noise in magnetic multilayers is considerably enhanced with respect to the noise of the single domain layer and attribute this to the complex domain structure of the multilayer.
Journal of Applied Physics | 1996
M. A. M. Gijs; J.B. Giesbers; J. W. van Est; J. Briaire; L.K.J. Vandamme; P. Beliën
We have investigated the room temperature 1/f noise of microstructured soft magnetic Ni80Fe20 films, showing the anisotropic magnetoresistance effect, and of Ni80Fe20/Cu magnetic multilayers, showing the giant magnetoresistance effect. We find that the 1/f noise in magnetic multilayers is considerably enhanced with respect to the noise of the single domain layer, which sets a limit on the usability of giant magnetoresistance materials for low‐frequency applications.
Microelectronics Reliability | 2000
J. Briaire; L.K.J. Vandamme
When noise is used as a diagnostic tool to determine the reliability of a device, not only the noise parameters itself, but also the uncertainty in these noise parameters are important. For good devices, this uncertainty will be Gaussian. However, because of non-linear measurement errors caused by a digital spectrum analyzer, this uncertainty might deviate from Gaussianity. We have estimated this additional error through simulations. We conclude that this error can often be ignored.
IEEE Transactions on Instrumentation and Measurement | 1999
R. J. W. Jonker; J. Briaire; L.K.J. Vandamme
Proceedings of the 16th International Conference | 2001
J. Briaire; L.K.J. Vandamme; M. A. M. Gijs
conference; 15th International conference on noise in physical systems and 1/f fluctuations, Hong Kong, 23-26 August 1999 | 1999
J. Briaire; L.K.J. Vandamme
conference; Proc. 14th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF), Leuven, Belgium, 14-18 July 1997 | 1997
J. Briaire; L.K.J. Vandamme; M. A. M. Gijs; C. Claeys; E. Simoen
Journal of Magnetism and Magnetic Materials | 1997
Martin A. M. Gijs; J. Ben Giesbers; P. Beliën; J. W. van Est; J. Briaire; L.K.J. Vandamme
Archive | 1996
J. Briaire; L.K.J. Vandamme; K.M. Schep; J.B. Giesbers; M. A. M. Gijs; Ch.R. Doering; L.B. Kiss; M.F. Shlesinger