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Featured researches published by J. Briaire.


Journal of Applied Physics | 1998

UNCERTAINTY IN GAUSSIAN NOISE GENERALIZED FOR CROSS-CORRELATION SPECTRA

J. Briaire; L.K.J. Vandamme

The ensemble average and variance of Gaussian noise measured as cross-correlation spectra are calculated as a function of the number of time averages. The calculations are based on the Carson–Campbell theorem which treats noise spectra as a collection of individual deterministic pulses transformed into the frequency domain. We have compared our calculations with experimental results on metal film resistors. There is an excellent agreement between the predicted and the measured statistical behavior.


Journal of Magnetism and Magnetic Materials | 1997

1/f Noise in magnetic Ni80Fe20 single layers and Ni80Fe20/Cu multilayers

M. A. M. Gijs; J.B. Giesbers; P. Beliën; J. W. van Est; J. Briaire; L.K.J. Vandamme

We have investigated the room temperature 1/f noise of microstructured soft magnetic Ni80Fe20 films, showing the anisotropic magnetoresistance effect, and of Ni80Fe20/Cu magnetic multilayers, showing the giant magnetoresistance effect. We find that the 1/f noise in magnetic multilayers is considerably enhanced with respect to the noise of the single domain layer and attribute this to the complex domain structure of the multilayer.


Journal of Applied Physics | 1996

1/f noise in magnetic Ni80Fe20 single layers and Ni80Fe20/Cu multilayers

M. A. M. Gijs; J.B. Giesbers; J. W. van Est; J. Briaire; L.K.J. Vandamme; P. Beliën

We have investigated the room temperature 1/f noise of microstructured soft magnetic Ni80Fe20 films, showing the anisotropic magnetoresistance effect, and of Ni80Fe20/Cu magnetic multilayers, showing the giant magnetoresistance effect. We find that the 1/f noise in magnetic multilayers is considerably enhanced with respect to the noise of the single domain layer, which sets a limit on the usability of giant magnetoresistance materials for low‐frequency applications.


Microelectronics Reliability | 2000

The influence of a digital spectrum analyzer on the uncertainty in 1/f noise parameters

J. Briaire; L.K.J. Vandamme

When noise is used as a diagnostic tool to determine the reliability of a device, not only the noise parameters itself, but also the uncertainty in these noise parameters are important. For good devices, this uncertainty will be Gaussian. However, because of non-linear measurement errors caused by a digital spectrum analyzer, this uncertainty might deviate from Gaussianity. We have estimated this additional error through simulations. We conclude that this error can often be ignored.


IEEE Transactions on Instrumentation and Measurement | 1999

Automated system for noise-measurements on low-ohmic samples and magnetic sensors

R. J. W. Jonker; J. Briaire; L.K.J. Vandamme


Proceedings of the 16th International Conference | 2001

1/f noise in thin single domain Ni80Fe20 films

J. Briaire; L.K.J. Vandamme; M. A. M. Gijs


conference; 15th International conference on noise in physical systems and 1/f fluctuations, Hong Kong, 23-26 August 1999 | 1999

Errors in the uncertainty of 1/f noise due to the spectrum analyzer

J. Briaire; L.K.J. Vandamme


conference; Proc. 14th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF), Leuven, Belgium, 14-18 July 1997 | 1997

Resistance and 1/f noise dependence on magnetic field in single Ni Fe layers and Ni Fe/Cu multilayers

J. Briaire; L.K.J. Vandamme; M. A. M. Gijs; C. Claeys; E. Simoen


Journal of Magnetism and Magnetic Materials | 1997

1/ f noise in magnetic Ni 80Fe 20 single layers and Ni 80Fe 20/Cu multilayers

Martin A. M. Gijs; J. Ben Giesbers; P. Beliën; J. W. van Est; J. Briaire; L.K.J. Vandamme


Archive | 1996

Noise and magnetic domain structure

J. Briaire; L.K.J. Vandamme; K.M. Schep; J.B. Giesbers; M. A. M. Gijs; Ch.R. Doering; L.B. Kiss; M.F. Shlesinger

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L.K.J. Vandamme

Eindhoven University of Technology

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J. W. van Est

Eindhoven University of Technology

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P. Beliën

Eindhoven University of Technology

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R. J. W. Jonker

Eindhoven University of Technology

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